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Authors: BELK JG SUDIJONO JL HOLMES DM MCCONVILLE CF JONES TS JOYCE BA
Citation: Jg. Belk et al., SPATIAL-DISTRIBUTION OF IN DURING THE INITIAL-STAGES OF GROWTH OF INAS ON GAAS(001)-C(4X4), Surface science, 365(3), 1996, pp. 735-742

Authors: MATSUMURA A FERNANDEZ JM THORNTON TJ HOLMES SN ZHANG J JOYCE BA
Citation: A. Matsumura et al., MAGNETOTRANSPORT OF 2-DIMENSIONAL ELECTRON-GAS IN SI SIGE MODULATION-DOPED STRUCTURES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/, Solid-state electronics, 40(1-8), 1996, pp. 399-403

Authors: SATO K FAHY MR ASHWIN MJ JOYCE BA
Citation: K. Sato et al., SILICON INCORPORATION BEHAVIOR IN GAAS GROWN ON GAAS (111)A BY MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 165(4), 1996, pp. 345-350

Authors: ZHANG J LEES AK TAYLOR AG RAISBECK D SHUKLA N FERNANDEZ JM JOYCE BA PEMBLE ME
Citation: J. Zhang et al., IN-SITU MONITORING OF SI AND SIGE GROWTH ON SI(001) SURFACES DURING GAS-SOURCE MOLECULAR-BEAM EPITAXY USING REFLECTANCE ANISOTROPY, Journal of crystal growth, 164(1-4), 1996, pp. 40-46

Authors: NAJI O ZHANG J KANEKO T JONES TS NEAVE JH JOYCE BA
Citation: O. Naji et al., A DETAILED TIME-OF-FLIGHT STUDY OF THE CRACKING PATTERN OF TRIMETHYLGALLIUM - IMPLICATIONS FOR MOMBE GROWTH, Journal of crystal growth, 164(1-4), 1996, pp. 58-65

Authors: JOYCE BA FERNANDEZ JM XIE MH MATSUMURA A ZHANG J TAYLOR AG
Citation: Ba. Joyce et al., GROWTH AND DOPING OF SI AND SIGE FILMS BY HYDRIDE GAS-SOURCE MOLECULAR-BEAM EPITAXY, Journal of crystal growth, 164(1-4), 1996, pp. 214-222

Authors: FERNANDEZ JM HART L ZHANG XM XIE MH ZHANG J JOYCE BA
Citation: Jm. Fernandez et al., SILICON SILICON-GERMANIUM MULTIPLE-QUANTUM WELLS GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY - HYDROGEN COVERAGE AND INTERFACIAL ABRUPTNESS/, Journal of crystal growth, 164(1-4), 1996, pp. 241-247

Authors: YAMAGUCHI H FAHY MR JOYCE BA
Citation: H. Yamaguchi et al., INHIBITIONS OF 3-DIMENSIONAL ISLAND FORMATION IN INAS FILMS GROWN ON GAAS(111)A SURFACE BY MOLECULAR-BEAM EPITAXY, Applied physics letters, 69(6), 1996, pp. 776-778

Authors: EDIRISINGHE SP STATONBEVAN A FAWCETT PN JOYCE BA
Citation: Sp. Edirisinghe et al., TRANSMISSION ELECTRON-MICROSCOPY STUDY OF IN0.25GA0.75AS EPILAYERS GROWN ON GAAS(001) BY MOLECULAR-BEAM EPITAXY - THE EFFECT OF EPILAYER THICKNESS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(3), 1995, pp. 967-973

Authors: FERNANDEZ JM MATSUMURA A ZHANG XM XIE MH HART L ZHANG J JOYCE BA THORNTON TJ
Citation: Jm. Fernandez et al., 2-DIMENSIONAL ELECTRON GASES IN SIGE SI HETEROSTRUCTURES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/, Journal of materials science. Materials in electronics, 6(5), 1995, pp. 330-335

Authors: JOYCE BA SHITARA T FAHY MR SATO K NEAVE JH FAWCETT PN KAMIYA I ZHANG XM
Citation: Ba. Joyce et al., MECHANISMS OF LAYER GROWTH DURING MOLECULAR-BEAM EPITAXY OF SEMICONDUCTOR-FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 30(2-3), 1995, pp. 87-97

Authors: HU SJ FAHY MR SATO K JOYCE BA
Citation: Sj. Hu et al., INCORPORATION OF SN ON GAAS (111)A SUBSTRATES BY MOLECULAR-BEAM EPITAXY, Journal of electronic materials, 24(8), 1995, pp. 1003-1006

Authors: MATSUMURA A FERNANDEZ JM THORNTON TJ PRASAD RS HOLMES SN ZHANG XM XIE MH ZHANG J JOYCE BA
Citation: A. Matsumura et al., CHARACTERIZATION OF N-CHANNEL SI SIGE MODULATION-DOPED STRUCTURES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/, Semiconductor science and technology, 10(9), 1995, pp. 1247-1252

Authors: FERNANDEZ JM XIE MH MATSUMURA A MOKLER SM ZHANG J JOYCE BA
Citation: Jm. Fernandez et al., ARSENIC INCORPORATION AND DOPING BEHAVIOR IN SILICON AND SIGE EPITAXIAL LAYERS GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY, Materials science and technology, 11(4), 1995, pp. 396-399

Authors: HOLMES DM BELK JG SUDIJONO JL NEAVE JH JONES TS JOYCE BA
Citation: Dm. Holmes et al., THE NATURE OF ISLAND FORMATION IN THE HOMOEPITAXIAL GROWTH OF GAAS(110), Surface science, 341(1-2), 1995, pp. 133-141

Authors: AVERY AR SUDIJONO JL JONES TS JOYCE BA
Citation: Ar. Avery et al., THE LOCATION OF SILICON ATOMS AND THE INITIAL-STAGES OF FORMATION OF THE SI GAAS(001) INTERFACE STUDIED BY STM/, Surface science, 340(1-2), 1995, pp. 57-70

Authors: AVERY AR HOLMES DM SUDIJONO J JONES TS JOYCE BA
Citation: Ar. Avery et al., THE AS-TERMINATED RECONSTRUCTIONS FORMED BY GAAS(001) - A SCANNING-TUNNELING-MICROSCOPY STUDY OF THE (2X4) AND C(4X4) SURFACES, Surface science, 323(1-2), 1995, pp. 91-101

Authors: TURNER AR PEMBLE ME FERNANDEZ JM JOYCE BA ZHANG J TAYLOR AG
Citation: Ar. Turner et al., REAL-TIME OBSERVATION OF REFLECTANCE ANISOTROPY AND REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING GAS-SOURCE MOLECULAR-BEAM-EPITAXY GROWTH SI AND SIGE ON SI(001), Physical review letters, 74(16), 1995, pp. 3213-3216

Authors: KANEKO T SMILAUER P JOYCE BA
Citation: T. Kaneko et al., REENTRANT LAYER-BY-LAYER ETCHING OF GAAS(001), Physical review letters, 74(16), 1995, pp. 3289-3292

Authors: PEMBLE ME SHUKLA N TURNER AR FERNANDEZ JM JOYCE BA ZHANG J TAYLOR AG BITZER T FREDERICK BG KITCHING KJ RICHARDSON NV
Citation: Me. Pemble et al., REFLECTANCE ANISOTROPY FROM NON-III-V SYSTEMS - SI AND SIGE GROWTH ON(001)SI AND ADSORBATE-INDUCED RECONSTRUCTION OF CU(110), Physica status solidi. a, Applied research, 152(1), 1995, pp. 61-70

Authors: MATSUMURA A THORNTON TJ FERNANDEZ JM HOLMES SN ZHANG J JOYCE BA
Citation: A. Matsumura et al., ELECTRON HEATING EFFECT ON TRANSPORT-PROPERTIES IN SI SIGE MODULATION-DOPED STRUCTURES GROWN BY GAS-SOURCE MOLECULAR-BEAM EPITAXY/, Journal of crystal growth, 157(1-4), 1995, pp. 373-377

Authors: ZHANG J ZHANG XM MATSUMURA A MARINOPOULOU A HARTUNG J ANWAR N PARRY G XIE MH MOKLER SM FERNANDEZ JM JOYCE BA
Citation: J. Zhang et al., GROWTH AND CHARACTERIZATION OF SI SIGE MICROSTRUCTURES ON PATTERNED SI SUBSTRATES USING GAS-SOURCE MOLECULAR-BEAM EPITAXY/, Journal of crystal growth, 150(1-4), 1995, pp. 950-954

Authors: ZHANG J TAYLOR AG FERNANDEZ JM JOYCE BA TURNER AR PEMBLE ME
Citation: J. Zhang et al., REFLECTANCE ANISOTROPY AND REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING GAS-SOURCE MOLECULAR-BEAM EPITAXY GROWTH OF SI AND SIGE ON SI(001), Journal of crystal growth, 150(1-4), 1995, pp. 1015-1019

Authors: SATO K FAHY MR KAMIYA I NEAVE JH JOYCE BA
Citation: K. Sato et al., REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION INTENSITY OSCILLATIONS DURING GROWTH OF (AL,CA)AS ON GAAS(111)A, Journal of crystal growth, 150(1-4), 1995, pp. 77-80

Authors: AVERY AR HOLMES DM SUDIJONO JL JONES TS FAHY MR JOYCE BA
Citation: Ar. Avery et al., A SCANNING-TUNNELING-MICROSCOPY STUDY OF THE DEPOSITION OF SI ON GAAS(001) IMPLICATIONS FOR SI DELTA-DOPING, Journal of crystal growth, 150(1-4), 1995, pp. 202-208
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