Citation: Zm. Li et Pa. Mawby, A FULLY-NUMERICAL MODEL FOR PIN DIODES IMPLEMENTED IN THE SABER CIRCUIT SIMULATOR, International journal of electronics, 84(4), 1998, pp. 295-305
Citation: Pm. Igic et Pa. Mawby, FINITE-ELEMENT MODELING OF THE THERMAL-STRESS FIELD DURING PROCESSINGOF VLSI MULTILEVEL STRUCTURES, Electronics Letters, 34(5), 1998, pp. 471-472
Citation: Zm. Li et al., A PHYSICAL INSIGHT INTO THE QUASI-SATURATION EFFECT IN VDMOS POWER TRANSISTORS, International journal of electronics, 83(1), 1997, pp. 13-22
Citation: J. Zeng et al., MODELING OF THE QUASI-SATURATION BEHAVIOR IN THE HIGH-VOLTAGE MOSFET WITH VERTICAL TRENCH GATE, IEE proceedings. Circuits, devices and systems, 143(1), 1996, pp. 28-32
Authors:
CHEN XB
MAWBY PA
SALAMA CAT
TOWERS MS
ZENG J
BOARD K
Citation: Xb. Chen et al., LATERAL HIGH-VOLTAGE DEVICES USING AN OPTIMIZED VARIATIONAL LATERAL DOPING, International journal of electronics, 80(3), 1996, pp. 449-459
Citation: J. Zeng et al., EFFECT OF CARRIER LIFETIMES ON FORWARD CHARACTERISTICS OF MOS-CONTROLLED THYRISTORS, IEE proceedings. Circuits, devices and systems, 142(3), 1995, pp. 205-207
Citation: Pa. Mawby et al., ELECTROTHERMAL SIMULATION OF POWER VDMOS TRANSISTORS, INTERNATIONAL JOURNAL OF NUMERICAL METHODS FOR HEAT & FLUID FLOW, 5(2), 1995, pp. 185-192
Citation: Zr. Hu et al., DEGRADATION IN ON-STATE CHARACTERISTICS OF IGBTS THROUGH SELF-HEATING, IEE proceedings. Circuits, devices and systems, 141(6), 1994, pp. 439-444
Authors:
MAWBY PA
HU ZR
TOWERS MS
EVANS MJ
BOARD K
Citation: Pa. Mawby et al., RECOMBINATION AND JOULE HEATING EFFECTS IN GTO THYRISTORS WITH SPATIALLY VARYING LIFETIMES, IEE proceedings. Circuits, devices and systems, 141(4), 1994, pp. 292-298
Citation: Zr. Hu et al., SIMULATION OF TRANSIENT SELF-HEATING DURING POWER VDMOS TRANSISTOR TURN-OFF, International journal of electronics, 77(4), 1994, pp. 525-534
Citation: M. Gault et al., SOLUTION TO THE WAVE-EQUATION IN THE NUMERICAL-SIMULATION OF BURIED HETEROSTRUCTURE LASERS, IEE proceedings. Part J, Optoelectronics, 140(1), 1993, pp. 44-48