Authors:
Campos, FJ
Mestres, N
Alsina, F
Pascual, J
Morvan, E
Godignon, P
Millan, J
Citation: Fj. Campos et al., Confocal micro-Raman scattering and Rutherford backscattering characterization of lattice damage in aluminum implanted 6H-SiC, DIAM RELAT, 8(2-5), 1999, pp. 357-360
Authors:
Campos, FJ
Mestres, N
Pascual, J
Morvan, E
Godignon, P
Millan, J
Citation: Fj. Campos et al., Confocal micro-Raman characterization of lattice damage in high energy aluminum implanted 6H-SiC, J APPL PHYS, 85(1), 1999, pp. 99-104