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Results:
1-15
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Results: 15
Authors:
OLIVO P
DALPASSO M
Citation: P. Olivo et M. Dalpasso, A BIST SCHEME FOR NONVOLATILE MEMORIES, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 12(1-2), 1998, pp. 139-144
Authors:
METRA C
FAVALLI M
OLIVO P
RICCO B
Citation: C. Metra et al., ONLINE DETECTION OF BRIDGING AND DELAY FAULTS IN FUNCTIONAL BLOCKS OFCMOS SELF-CHECKING CIRCUITS, IEEE transactions on computer-aided design of integrated circuits and systems, 16(7), 1997, pp. 770-776
Authors:
MALAGUTI F
GIARDINA G
OLIVO P
Citation: F. Malaguti et al., DECHANNELING IN SINGLE-CRYSTALS DUE TO IN-FLIGHT SECONDARY DECAY - A METHOD FOR MEASURING SHORT NUCLEAR LIFETIMES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(3), 1997, pp. 341-348
Authors:
PAVAN P
BEZ R
OLIVO P
ZANONI E
Citation: P. Pavan et al., FLASH MEMORY CELLS - AN OVERVIEW, Proceedings of the IEEE, 85(8), 1997, pp. 1248-1271
Authors:
FAVALLI M
DALPASSO M
OLIVO P
Citation: M. Favalli et al., MODELING AND SIMULATION OF BROKEN CONNECTIONS IN CMOS ICS, IEEE transactions on computer-aided design of integrated circuits and systems, 15(7), 1996, pp. 808-814
Authors:
DALPASSO M
FAVALLI M
OLIVO P
Citation: M. Dalpasso et al., I-DDQ TEST INVALIDATION BY BREAK FAULTS, Electronics Letters, 32(11), 1996, pp. 994-995
Authors:
METRA C
FAVALLI M
OLIVO P
RICCO B
Citation: C. Metra et al., DESIGN OF CMOS CHECKERS WITH IMPROVED TESTABILITY OF BRIDGING AND TRANSISTOR STUCK-ON FAULTS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 6(1), 1995, pp. 7-22
Authors:
NERI B
OLIVO P
SALETTI R
SIGNORETTA M
Citation: B. Neri et al., DIELECTRIC-BREAKDOWN AND RELIABILITY OF MOS MICROSTRUCTURES - TRADITIONAL CHARACTERIZATION AND LOW-FREQUENCY NOISE MEASUREMENTS, Microelectronics and reliability, 35(3), 1995, pp. 529-537
Authors:
LANZONI M
RIVA C
OLIVO P
Citation: M. Lanzoni et al., CHARACTERIZATION OF FLASH STRUCTURES ERASED WITH ULTRASHORT PULSES, Microelectronics, 25(7), 1994, pp. 491-494
Authors:
OLIVO P
SUNE J
Citation: P. Olivo et J. Sune, QUANTUM EFFECTS IN ACCUMULATED MOS THIN DIELECTRIC STRUCTURES, Microelectronics, 25(7), 1994, pp. 523-531
Authors:
DALPASSO M
FAVALLI M
OLIVO P
TEIXEIRA JP
Citation: M. Dalpasso et al., REALISTIC TESTABILITY ESTIMATES FOR CMOS ICS, Electronics Letters, 30(19), 1994, pp. 1593-1595
Authors:
DALPASSO M
FAVALLI M
OLIVO P
RICCO B
Citation: M. Dalpasso et al., FAULT SIMULATION OF PARAMETRIC BRIDGING FAULTS IN CMOS ICS, IEEE transactions on computer-aided design of integrated circuits and systems, 12(9), 1993, pp. 1403-1410
Authors:
LANZONI M
SUNE J
OLIVO P
RICCO B
Citation: M. Lanzoni et al., ADVANCED ELECTRICAL-LEVEL MODELING OF EEPROM CELLS, I.E.E.E. transactions on electron devices, 40(5), 1993, pp. 951-957
Authors:
SUNE J
LANZONI M
OLIVO P
Citation: J. Sune et al., TEMPERATURE-DEPENDENCE OF FOWLER-NORDHEIM INJECTION FROM ACCUMULATED N-TYPE SILICON INTO SILICON DIOXIDE, I.E.E.E. transactions on electron devices, 40(5), 1993, pp. 1017-1019
Authors:
LANZONI M
FAVALLI M
AMBANELLI M
OLIVO P
RICCO B
Citation: M. Lanzoni et al., AN EXPERIMENTAL-STUDY OF TESTING TECHNIQUES FOR BRIDGING FAULTS IN CMOS ICS, IEEE journal of solid-state circuits, 28(6), 1993, pp. 686-690
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1-15
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