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Results:
1-11
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Results: 11
Authors:
RUDKEVICH E
LIU F
SAVAGE DE
KUECH TF
MCCAUGHAN L
LAGALLY MG
Citation: E. Rudkevich et al., HYDROGEN-INDUCED SI SURFACE SEGREGATION ON GE-COVERED SI(001), Physical review letters, 81(16), 1998, pp. 3467-3470
Authors:
RUDKEVICH E
SAVAGE DE
CAI W
BEAN JC
SULLIVAN JS
NAYAK S
KUECH TF
MCCAUGHAN L
LAGALLY MG
Citation: E. Rudkevich et al., EXTENDED-SPECTRAL-RANGE FOURIER-TRANSFORM INFRARED-ATTENUATED TOTAL-REFLECTION SPECTROSCOPY ON SI SURFACES USING A NOVEL SI COATED GE ATTENUATED TOTAL-REFLECTION PRISM, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(4), 1997, pp. 2153-2157
Authors:
CONSTINE LS
SCHWARTZ RG
SAVAGE DE
KING V
MUHS A
Citation: Ls. Constine et al., CARDIAC-FUNCTION, PERFUSION, AND MORBIDITY IN IRRADIATED LONG-TERM SURVIVORS OF HODGKINS-DISEASE, International journal of radiation oncology, biology, physics, 39(4), 1997, pp. 897-906
Authors:
MACKAY JF
TEICHERT C
SAVAGE DE
LAGALLY MG
Citation: Jf. Mackay et al., ELEMENT-SPECIFIC MAGNETIZATION OF BURIED INTERFACES PROBED BY DIFFUSE-X-RAY RESONANT MAGNETIC SCATTERING, Physical review letters, 77(18), 1996, pp. 3925-3928
Authors:
NAYAK S
HUANG JW
REDWING JM
SAVAGE DE
LAGALLY MG
KUECH TF
Citation: S. Nayak et al., INFLUENCE OF OXYGEN ON SURFACE-MORPHOLOGY OF METALORGANIC VAPOR-PHASEEPITAXY-GROWN GAAS(001), Applied physics letters, 68(9), 1996, pp. 1270-1272
IN-SITU RHEED AND AFM INVESTIGATION OF GROWTH FRONT MORPHOLOGY EVOLUTION OF SI(001) GROWN BY UHV-CVD
Authors:
NAYAK S
SAVAGE DE
CHU HN
LAGALLY MG
KUECH TF
Citation: S. Nayak et al., IN-SITU RHEED AND AFM INVESTIGATION OF GROWTH FRONT MORPHOLOGY EVOLUTION OF SI(001) GROWN BY UHV-CVD, Journal of crystal growth, 157(1-4), 1995, pp. 168-171
Authors:
TEICHERT C
MACKAY JF
SAVAGE DE
LAGALLY MG
BROHL M
WAGNER P
Citation: C. Teichert et al., COMPARISON OF SURFACE-ROUGHNESS OF POLISHED SILICON-WAFERS MEASURED BY LIGHT-SCATTERING TOPOGRAPHY, SOFT-X-RAY SCATTERING, AND ATOMIC-FORCEMICROSCOPY, Applied physics letters, 66(18), 1995, pp. 2346-2348
Authors:
REDWING JM
NAYAK S
SAVAGE DE
LAGALLY MG
DAWSONELLI DF
KUECH TF
Citation: Jm. Redwing et al., THE EFFECT OF CONTROLLED IMPURITY INCORPORATION ON INTERFACIAL ROUGHNESS IN GAAS ALXGA1-XAS SUPERLATTICE STRUCTURES GROWN BY METALORGANIC VAPOR-PHASE EPITAXY/, Journal of crystal growth, 145(1-4), 1994, pp. 792-798
Authors:
WU F
JALOVIAR SG
SAVAGE DE
LAGALLY MG
Citation: F. Wu et al., ROUGHENING OF STEPS DURING HOMOEPITAXIAL GROWTH ON SI(001), Physical review letters, 71(25), 1993, pp. 4190-4193
Authors:
PHANG YH
SAVAGE DE
KARIOTIS R
LAGALLY MG
Citation: Yh. Phang et al., X-RAY-DIFFRACTION MEASUREMENT OF PARTIALLY CORRELATED INTERFACIAL ROUGHNESS IN MULTILAYERS, Journal of applied physics, 74(5), 1993, pp. 3181-3188
Authors:
SAVAGE DE
PHANG YH
ROWND JJ
MACKAY JF
LAGALLY MG
Citation: De. Savage et al., DETERMINATION OF INTERFACIAL ROUGHNESS CORRELATION IN W C MULTILAYER FILMS - COMPARISON USING SOFT AND HARD X-RAY-DIFFRACTION/, Journal of applied physics, 74(10), 1993, pp. 6158-6164
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1-11
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