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Results: 51-75/102
Authors:
ANDO A
MIKI K
MATSUMOTO K
SHIMIZU T
MORITA Y
TOKUMOTO H
Citation: A. Ando et al., SURFACE OBSERVATION AND MODIFICATION OF SI SUBSTRATE IN NH4F AND H2SO4 SOLUTIONS, JPN J A P 1, 35(2B), 1996, pp. 1064-1068
Authors:
OHNO H
NAGAHARA LA
GWO S
MIZUTANI W
TOKUMOTO H
Citation: H. Ohno et al., NANOMETER-SCALE WIRES OF MONOLAYER HEIGHT ALKANETHIOLS ON ALGAAS GAASHETEROSTRUCTURES BY SELECTIVE CHEMISORPTION/, JPN J A P 2, 35(4B), 1996, pp. 512-515
Authors:
OOHIRA T
SAKAI S
KASAI Y
SHIMIZU T
TOKUMOTO H
SHIMIZU K
Citation: T. Oohira et al., A DIGITAL METHOD OF GAS-LASER ETCHING FOR OXIDE SUPERCONDUCTORS, JPN J A P 2, 35(1B), 1996, pp. 94-96
Authors:
GRUVERMAN A
AUCIELLO O
TOKUMOTO H
Citation: A. Gruverman et al., SCANNING FORCE MICROSCOPY FOR THE STUDY OF DOMAIN-STRUCTURE IN FERROELECTRIC THIN-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 602-605
Authors:
NAGAHARA LA
TOKUMOTO H
Citation: La. Nagahara et H. Tokumoto, SCANNING NEAR-FIELD OPTICAL MICROSCOPY SPECTROSCOPY OF THIN ORGANIC FILMS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 800-803
Authors:
YAMADA H
TOKUMOTO H
AKAMINE S
FUKUZAWA K
KUWANO H
Citation: H. Yamada et al., IMAGING OF ORGANIC MOLECULAR FILMS USING A SCANNING NEAR-FIELD OPTICAL MICROSCOPE COMBINED WITH AN ATOMIC-FORCE MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 812-815
Authors:
NAKAMURA M
MORITA Y
MORI Y
ISHITANI A
TOKUMOTO H
Citation: M. Nakamura et al., MOLECULAR ARRANGEMENT OF COPPER PHTHALOCYANINE ON HYDROGEN-TERMINATEDSI(111) - INFLUENCE OF SURFACE-ROUGHNESS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1109-1113
Authors:
MORITA Y
TOKUMOTO H
Citation: Y. Morita et H. Tokumoto, ATOMIC-SCALE FLATTENING AND HYDROGEN TERMINATION OF THE SI(001) SURFACE BY WET-CHEMICAL TREATMENT, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 854-858
Authors:
MORITA Y
TOKUMOTO H
Citation: Y. Morita et H. Tokumoto, STM ANALYSIS OF WET-CHEMICALLY PREPARED H-SI(001) SURFACE, Applied surface science, 101, 1996, pp. 440-443
Authors:
MOTOMATSU M
MIZUTANI W
NIE HY
TOKUMOTO H
Citation: M. Motomatsu et al., SURFACE-STRUCTURE OF A FLUORINATED THIOL ON AU(111) BY SCANNING FORCEMICROSCOPY, Thin solid films, 282(1-2), 1996, pp. 548-551
Authors:
NAGAHARA LA
TOKUMOTO H
Citation: La. Nagahara et H. Tokumoto, DEVELOPMENT OF A NEAR-FIELD OPTICAL-SYSTEM FOR INVESTIGATING THIN ORGANIC FILMS, Thin solid films, 282(1-2), 1996, pp. 647-650
Authors:
MIZUTANI W
MOTOMATSU M
TOKUMOTO H
Citation: W. Mizutani et al., SCANNING-TUNNELING-MICROSCOPY OF DIBUTYLAMINO-TRIAZINE-DITHIOL MONOLAYER ON AU(111), Thin solid films, 273(1-2), 1996, pp. 70-75
Authors:
NIE HY
MOTOMATSU M
MIZUTANI W
TOKUMOTO H
Citation: Hy. Nie et al., LOCAL ELASTICITY MEASUREMENT ON POLYMERS USING ATOMIC-FORCE MICROSCOPY, Thin solid films, 273(1-2), 1996, pp. 143-148
Authors:
MOTOMATSU M
NIE HY
MIZUTANI W
TOKUMOTO H
Citation: M. Motomatsu et al., SCANNING FORCE MICROSCOPY APPLICATION TO POLYMER SURFACES FOR NOVEL NANOSCALE SURFACE CHARACTERIZATION, Thin solid films, 273(1-2), 1996, pp. 304-307
Authors:
KOMEDA T
GWO S
TOKUMOTO H
Citation: T. Komeda et al., MOS INTERFACE CHARACTERIZATION BY CROSS-SECTIONAL STM, Surface science, 358(1-3), 1996, pp. 38-41
Authors:
GWO S
OHNO H
MIWA S
FAN JF
TOKUMOTO H
Citation: S. Gwo et al., STRUCTURAL AND DOPING PROPERTIES OF MOLECULAR-BEAM EPITAXY-GROWN SI-DOPED GAAS(001) SURFACES, Surface science, 358(1-3), 1996, pp. 446-450
Authors:
KOMEDA T
MORITA Y
TOKUMOTO H
Citation: T. Komeda et al., SURFACE ROUGHENING AND METASTABLE SUPERSTRUCTURES ON WET-PROCESSED SI(111) SURFACE-INDUCED BY HYDROGEN DESORPTION, Surface science, 348(1-2), 1996, pp. 153-160
Authors:
JARVIS SP
YAMADA H
YAMAMOTO SI
TOKUMOTO H
Citation: Sp. Jarvis et al., A NEW FORCE CONTROLLED ATOMIC-FORCE MICROSCOPE FOR USE IN ULTRAHIGH-VACUUM, Review of scientific instruments, 67(6), 1996, pp. 2281-2285
Authors:
MOTOMATSU M
NIE HY
MIZUTANI W
TOKUMOTO H
Citation: M. Motomatsu et al., SURFACE-MORPHOLOGY STUDY OF POLY(ETHYLENE OXIDE) CRYSTALS BY SCANNINGFORCE MICROSCOPY, Polymer, 37(1), 1996, pp. 183-185
Authors:
JARVIS SP
YAMADA H
YAMAMOTO SL
TOKUMOTO H
PETHICA JB
Citation: Sp. Jarvis et al., DIRECT MECHANICAL MEASUREMENT OF INTERATOMIC POTENTIALS, Nature, 384(6606), 1996, pp. 247-249
Authors:
GRUVERMAN A
AUCIELLO O
TOKUMOTO H
Citation: A. Gruverman et al., NANOSCALE INVESTIGATION OF FATIGUE EFFECTS IN PB(ZR,TI)O-3 FILMS, Applied physics letters, 69(21), 1996, pp. 3191-3193
Authors:
YAMAMOTO S
YAMADA H
TOKUMOTO H
Citation: S. Yamamoto et al., NANOMETER MODIFICATIONS OF NONCONDUCTIVE MATERIALS USING RESIST-FILMSBY ATOMIC-FORCE MICROSCOPY, JPN J A P 1, 34(6B), 1995, pp. 3396-3399
Authors:
ANDO A
MIKI K
SHIMIZU T
MATSUMOTO K
MORITA Y
TOKUMOTO H
Citation: A. Ando et al., ELECTROCHEMICAL SCANNING-TUNNELING-MICROSCOPY AND ATOMIC-FORCE MICROSCOPY OBSERVATIONS ON SI(111) IN SEVERAL SOLUTIONS, JPN J A P 1, 34(2B), 1995, pp. 715-718
Authors:
OHNO H
MOTOMATSU M
MIZUTANI W
TOKUMOTO H
Citation: H. Ohno et al., AFM OBSERVATION OF SELF-ASSEMBLED MONOLAYER FILMS ON GAAS(110), JPN J A P 1, 34(2B), 1995, pp. 1381-1386
Authors:
MIZUTANI W
OHI A
MOTOMATSU M
TOKUMOTO H
Citation: W. Mizutani et al., STEP FORMATION ON AU (111) OBSERVED BY SCANNING TUNNELING MICROSCOPE, JPN J A P 2, 34(9A), 1995, pp. 1151-1154