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Results: 1-21 |
Results: 21
CONTINUOUS SINGLE-CRYSTAL PBTIO3 THIN-FILMS EPITAXIALLY GROWN ON MISCUT (001)SRTIO3
Authors: WASA K HANEDA Y SATOH T ADACHI H KANNO I SETSUNE K SCHLOM DG TROLIERMCKINSTRY S EOM CB
Citation: K. Wasa et al., CONTINUOUS SINGLE-CRYSTAL PBTIO3 THIN-FILMS EPITAXIALLY GROWN ON MISCUT (001)SRTIO3, Journal of the Korean Physical Society, 32, 1998, pp. 1344-1348
STRESS-DEPENDENT PIEZOELECTRIC PROPERTIES OF FERROELECTRIC LEAD-ZIRCONATE-TITANATE FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY
Authors: ZAVALA G FENDLER JH TROLIERMCKINSTRY S
Citation: G. Zavala et al., STRESS-DEPENDENT PIEZOELECTRIC PROPERTIES OF FERROELECTRIC LEAD-ZIRCONATE-TITANATE FILMS STUDIED BY ATOMIC-FORCE MICROSCOPY, Journal of the Korean Physical Society, 32, 1998, pp. 1464-1467
COMPOSITION PROFILING OF GRADED DIELECTRIC FUNCTION MATERIALS BY SPECTROSCOPIC ELLIPSOMETRY
Authors: TROLIERMCKINSTRY S KOH J
Citation: S. Troliermckinstry et J. Koh, COMPOSITION PROFILING OF GRADED DIELECTRIC FUNCTION MATERIALS BY SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 313, 1998, pp. 389-393
THE INFLUENCE OF ENERGETIC BOMBARDMENT ON THE STRUCTURE AND PROPERTIES OF EPITAXIAL SRRUO3 THIN-FILMS GROWN BY PULSED-LASER DEPOSITION
Authors: MARIA JP TROLIERMCKINSTRY S SCHLOM DG HAWLEY ME BROWN GW
Citation: Jp. Maria et al., THE INFLUENCE OF ENERGETIC BOMBARDMENT ON THE STRUCTURE AND PROPERTIES OF EPITAXIAL SRRUO3 THIN-FILMS GROWN BY PULSED-LASER DEPOSITION, Journal of applied physics, 83(8), 1998, pp. 4373-4379
PIEZOELECTRICITY IN FERROELECTRIC THIN-FILMS - DOMAIN AND STRESS ISSUES
Authors: TROLIERMCKINSTRY S SHEPARD JF LACEY JL SU T ZAVALA G FENDLER J
Citation: S. Troliermckinstry et al., PIEZOELECTRICITY IN FERROELECTRIC THIN-FILMS - DOMAIN AND STRESS ISSUES, Ferroelectrics, 206(1-4), 1998, pp. 381-392
DIELECTRIC FUNCTIONS OF COMMON YBCO SUBSTRATE MATERIALS DETERMINED BYSPECTROSCOPIC ELLIPSOMETRY
Authors: GIBBONS BJ TROLIERMCKINSTRY S
Citation: Bj. Gibbons et S. Troliermckinstry, DIELECTRIC FUNCTIONS OF COMMON YBCO SUBSTRATE MATERIALS DETERMINED BYSPECTROSCOPIC ELLIPSOMETRY, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 2177-2180
STRUCTURAL AND ELECTRICAL-PROPERTIES OF ANTIFERROELECTRIC LEAD ZIRCONATE THIN-FILMS PREPARED BY REACTIVE MAGNETRON COSPUTTERING
Authors: YAMAKAWA K GACHIGI KW TROLIERMCKINSTRY S DOUGHERTY JP
Citation: K. Yamakawa et al., STRUCTURAL AND ELECTRICAL-PROPERTIES OF ANTIFERROELECTRIC LEAD ZIRCONATE THIN-FILMS PREPARED BY REACTIVE MAGNETRON COSPUTTERING, Journal of Materials Science, 32(19), 1997, pp. 5169-5176
CHARACTERIZATION OF FERROELECTRIC LEAD-ZIRCONATE-TITANATE FILMS BY SCANNING FORCE MICROSCOPY
Authors: ZAVALA G FENDLER JH TROLIERMCKINSTRY S
Citation: G. Zavala et al., CHARACTERIZATION OF FERROELECTRIC LEAD-ZIRCONATE-TITANATE FILMS BY SCANNING FORCE MICROSCOPY, Journal of applied physics, 81(11), 1997, pp. 7480-7491
PREPARATION AND STRUCTURE OF PBZRO3 FILMS BY KRF PULSED-LASER DEPOSITION
Authors: KIM IW JIN BM TROLIERMCKINSTRY S DOUGHERTY JP
Citation: Iw. Kim et al., PREPARATION AND STRUCTURE OF PBZRO3 FILMS BY KRF PULSED-LASER DEPOSITION, Ferroelectrics, 196(1-4), 1997, pp. 347-350
SOL-GEL DERIVED SRBI2TA2O9 THIN-FILMS AND ELECTRICAL-PROPERTIES
Authors: YAMAKAWA K RAVICHANDRAN D BHALLA AS TROLIERMCKINSTRY S DOUGHERTY JP ROY R
Citation: K. Yamakawa et al., SOL-GEL DERIVED SRBI2TA2O9 THIN-FILMS AND ELECTRICAL-PROPERTIES, Ferroelectrics. Letters section, 22(1-2), 1996, pp. 41-45
PHASE-TRANSITIONS OF ANTIFERROELECTRIC LEAD ZIRCONATE THIN-FILMS IN HIGH-ELECTRIC-FIELD
Authors: YAMAKAWA K GACHIGI KW TROLIERMCKINSTRY S DOUGHERTY JP
Citation: K. Yamakawa et al., PHASE-TRANSITIONS OF ANTIFERROELECTRIC LEAD ZIRCONATE THIN-FILMS IN HIGH-ELECTRIC-FIELD, Ferroelectrics. Letters section, 20(5-6), 1996, pp. 149-155
PREPARATION OF LEAD-ZIRCONATE-TITANATE THIN-FILMS BY REACTIVE MAGNETRON COSPUTTERING
Authors: YAMAKAWA K TROLIERMCKINSTRY S DOUGHERTY JP
Citation: K. Yamakawa et al., PREPARATION OF LEAD-ZIRCONATE-TITANATE THIN-FILMS BY REACTIVE MAGNETRON COSPUTTERING, Materials letters, 28(4-6), 1996, pp. 317-322
PT TI SIO2 SI SUBSTRATES
Authors: FOX GR TROLIERMCKINSTRY S KRUPANIDHI SB CASAS LM
Citation: Gr. Fox et al., PT TI SIO2 SI SUBSTRATES, Journal of materials research, 10(6), 1995, pp. 1508-1515
THE FORMATION OF A ZIRCONATE PHASE WITHIN THE EMISSION MIX FOR LOW-PRESSURE HG-AR DISCHARGE LAMPS
Authors: SHI J TROLIERMCKINSTRY S BERNECKER CA
Citation: J. Shi et al., THE FORMATION OF A ZIRCONATE PHASE WITHIN THE EMISSION MIX FOR LOW-PRESSURE HG-AR DISCHARGE LAMPS, Journal of the Illuminating Engineering Society, 24(1), 1995, pp. 100
IN-SITU X-RAY STUDIES OF PHASE-TRANSFORMATIONS IN LEAD-ZIRCONATE-TITANATE THIN-FILMS DURING ANNEALING
Authors: AUNGKAVATTANA P HAARTZ B RUUD CO TROLIERMCKINSTRY S
Citation: P. Aungkavattana et al., IN-SITU X-RAY STUDIES OF PHASE-TRANSFORMATIONS IN LEAD-ZIRCONATE-TITANATE THIN-FILMS DURING ANNEALING, Thin solid films, 268(1-2), 1995, pp. 102-107
REACTIVE MAGNETRON CO-SPUTTERED ANTIFERROELECTRIC LEAD ZIRCONATE THIN-FILMS
Authors: YAMAKAWA K TROLIERMCKINSTRY S DOUGHERTY JP KRUPANIDHI SB
Citation: K. Yamakawa et al., REACTIVE MAGNETRON CO-SPUTTERED ANTIFERROELECTRIC LEAD ZIRCONATE THIN-FILMS, Applied physics letters, 67(14), 1995, pp. 2014-2016
CHARACTERIZATION OF OPTICAL THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY
Authors: TROLIERMCKINSTRY S CHINDAUDOM P VEDAM K HIREMATH BV
Citation: S. Troliermckinstry et al., CHARACTERIZATION OF OPTICAL THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY, Journal of the American Ceramic Society, 78(9), 1995, pp. 2412-2416
IN-SITU ANNEALING STUDIES OF SOL-GEL FERROELECTRIC THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY
Authors: TROLIERMCKINSTRY S CHEN JY VEDAM K NEWNHAM RE
Citation: S. Troliermckinstry et al., IN-SITU ANNEALING STUDIES OF SOL-GEL FERROELECTRIC THIN-FILMS BY SPECTROSCOPIC ELLIPSOMETRY, Journal of the American Ceramic Society, 78(7), 1995, pp. 1907-1913
SPECTROSCOPIC ELLIPSOMETRY INVESTIGATION OF AMORPHOUS-SILICON NITRIDETHIN-FILMS
Authors: TROLIERMCKINSTRY S HU HG CARIM AH
Citation: S. Troliermckinstry et al., SPECTROSCOPIC ELLIPSOMETRY INVESTIGATION OF AMORPHOUS-SILICON NITRIDETHIN-FILMS, Journal of the Electrochemical Society, 141(9), 1994, pp. 2483-2486
SENSORS, ACTUATORS, AND SMART MATERIALS
Authors: TROLIERMCKINSTRY S NEWNHAM RE
Citation: S. Troliermckinstry et Re. Newnham, SENSORS, ACTUATORS, AND SMART MATERIALS, MRS bulletin, 18(4), 1993, pp. 27-33
SPECTROSCOPIC ELLIPSOMETRY STUDIES ON ION-BEAM SPUTTER-DEPOSITED PB(ZR, TI)O3 FILMS ON SAPPHIRE AND PT-COATED SILICON SUBSTRATES
Authors: TROLIERMCKINSTRY S HU H KRUPANIDHI SB CHINDAUDOM P VEDAM K NEWNHAM RE
Citation: S. Troliermckinstry et al., SPECTROSCOPIC ELLIPSOMETRY STUDIES ON ION-BEAM SPUTTER-DEPOSITED PB(ZR, TI)O3 FILMS ON SAPPHIRE AND PT-COATED SILICON SUBSTRATES, Thin solid films, 230(1), 1993, pp. 15-27
Risultati: 1-21 |