AAAAAA

   
Results: 1-25 | 26-28
Results: 1-25/28
MEASUREMENT TECHNOLOGY USING THERMAL WAVE S
Authors: SCHMITZ B WALTHER HG
Citation: B. Schmitz et Hg. Walther, MEASUREMENT TECHNOLOGY USING THERMAL WAVE S, TM. Technisches Messen, 65(5), 1998, pp. 175-176
HARDNESS DEPTH PROFILING IN STEEL BY PHOT OTHERMAL TESTING
Authors: WALTHER HG LAN TTN
Citation: Hg. Walther et Ttn. Lan, HARDNESS DEPTH PROFILING IN STEEL BY PHOT OTHERMAL TESTING, TM. Technisches Messen, 65(5), 1998, pp. 185-191
QUANTITATIVE CHARACTERIZATION OF SUBSURFA CE INHOMOGENEITIES BY THERMAL WAVES
Authors: SEIDEL U WALTHER HG
Citation: U. Seidel et Hg. Walther, QUANTITATIVE CHARACTERIZATION OF SUBSURFA CE INHOMOGENEITIES BY THERMAL WAVES, TM. Technisches Messen, 65(5), 1998, pp. 204-210
DETERMINATION OF DEEP LEVELS PARAMETERS IN EPI-GAAS BY A TRANSIENT ACOUSTOELECTRIC TECHNIQUE
Authors: OSTROVSKII IV SAIKO SV WALTHER HG
Citation: Iv. Ostrovskii et al., DETERMINATION OF DEEP LEVELS PARAMETERS IN EPI-GAAS BY A TRANSIENT ACOUSTOELECTRIC TECHNIQUE, Journal of physics. D, Applied physics (Print), 31(18), 1998, pp. 2319-2325
SYSTEMATIC-ERRORS OF LOCALLY RESOLVED PHOTOTHERMAL RADIOMETRIC MEASUREMENTS
Authors: WALTHER HG KITZING T
Citation: Hg. Walther et T. Kitzing, SYSTEMATIC-ERRORS OF LOCALLY RESOLVED PHOTOTHERMAL RADIOMETRIC MEASUREMENTS, Journal of applied physics, 84(3), 1998, pp. 1163-1167
INVESTIGATION OF IMPLANTED LAYERS IN SILICON-CARBIDE BY A MODULATION PHOTOREFLECTION METHOD
Authors: WALTHER HG KARGE H MURATIKOV KL SUVOROV AV USOV IO
Citation: Hg. Walther et al., INVESTIGATION OF IMPLANTED LAYERS IN SILICON-CARBIDE BY A MODULATION PHOTOREFLECTION METHOD, Technical physics letters, 23(7), 1997, pp. 500-503
QUANTITATIVE CHARACTERIZATION OF MATERIAL INHOMOGENEITIES BY THERMAL WAVES
Authors: SEIDEL U LAN TTN WALTHER HG SCHMITZ B GEERKENS J GOCH G
Citation: U. Seidel et al., QUANTITATIVE CHARACTERIZATION OF MATERIAL INHOMOGENEITIES BY THERMAL WAVES, Optical engineering, 36(2), 1997, pp. 376-390
PHOTOTHERMAL RADIOMETRY OF INFRARED TRANSLUCENT MATERIALS
Authors: PAOLONI S WALTHER HG
Citation: S. Paoloni et Hg. Walther, PHOTOTHERMAL RADIOMETRY OF INFRARED TRANSLUCENT MATERIALS, Journal of applied physics, 82(1), 1997, pp. 101-106
PHOTOTHERMAL REFLECTANCE INVESTIGATION OF ION-IMPLANTED 6H-SIC
Authors: MURATIKOV KL USOV IO WALTHER HG KARGE H SUVOROV AV
Citation: Kl. Muratikov et al., PHOTOTHERMAL REFLECTANCE INVESTIGATION OF ION-IMPLANTED 6H-SIC, Applied physics letters, 71(20), 1997, pp. 3001-3003
PHOTOACOUSTIC MEASUREMENTS OF HIDDEN MATERIAL PROPERTIES
Authors: WALTHER HG
Citation: Hg. Walther, PHOTOACOUSTIC MEASUREMENTS OF HIDDEN MATERIAL PROPERTIES, Acustica, 82, 1996, pp. 123-123
QUANTITATIVE THERMAL-WAVE IMAGING - THE ESTIMATION OF DEPTH, SIZE ANDMAGNITUDE OF MATERIAL INHOMOGENEITIES
Authors: SEIDEL U WALTHER HG
Citation: U. Seidel et Hg. Walther, QUANTITATIVE THERMAL-WAVE IMAGING - THE ESTIMATION OF DEPTH, SIZE ANDMAGNITUDE OF MATERIAL INHOMOGENEITIES, Progress in Natural Science, 6, 1996, pp. 142-145
RADIOMETRIC DEPTH PROFILING OF THERMAL-PROPERTIES IN METALS
Authors: LAN TTN SEIDEL U WALTHER HG KALUS G
Citation: Ttn. Lan et al., RADIOMETRIC DEPTH PROFILING OF THERMAL-PROPERTIES IN METALS, Progress in Natural Science, 6, 1996, pp. 211-214
ROUGHNESS EFFECTS ON TRANSIENT SURFACE HEATING AND THERMAL-PROPERTIES, SIMULATED BY FINITE-ELEMENT SOLUTIONS OF THE DIFFUSION EQUATION
Authors: KIEPERT W BEIN BK GU JH PELZL J WALTHER HG
Citation: W. Kiepert et al., ROUGHNESS EFFECTS ON TRANSIENT SURFACE HEATING AND THERMAL-PROPERTIES, SIMULATED BY FINITE-ELEMENT SOLUTIONS OF THE DIFFUSION EQUATION, Progress in Natural Science, 6, 1996, pp. 317-320
PHOTOTHERMAL CHARACTERIZATION OF ION-IMPLANTED SIC
Authors: WALTHER HG KARGE H MURATIKOV K
Citation: Hg. Walther et al., PHOTOTHERMAL CHARACTERIZATION OF ION-IMPLANTED SIC, Progress in Natural Science, 6, 1996, pp. 511-514
THE PROBLEM OF AN UNFIT RULER IN EUROPE D URING THE LATE-MIDDLE-AGES - THEORY AND PRACTICE
Authors: WALTHER HG
Citation: Hg. Walther, THE PROBLEM OF AN UNFIT RULER IN EUROPE D URING THE LATE-MIDDLE-AGES - THEORY AND PRACTICE, Zeitschrift fur historische Forschung, 23(1), 1996, pp. 1-28
INFLUENCE OF THE SPECTRAL EMISSIVITY ON THE SIGNAL PHASE AT PHOTOTHERMAL RADIOMETRY
Authors: SEIDEL U WALTHER HG
Citation: U. Seidel et Hg. Walther, INFLUENCE OF THE SPECTRAL EMISSIVITY ON THE SIGNAL PHASE AT PHOTOTHERMAL RADIOMETRY, Review of scientific instruments, 67(10), 1996, pp. 3658-3663
PHOTOTHERMAL DEPTH PROFILING USING ONLY PHASE DATA
Authors: LAN TTN WALTHER HG
Citation: Ttn. Lan et Hg. Walther, PHOTOTHERMAL DEPTH PROFILING USING ONLY PHASE DATA, Journal of applied physics, 80(9), 1996, pp. 5289-5291
EXPERIMENTAL RESULTS OF PHOTOTHERMAL MICROSTRUCTURAL DEPTH PROFILING
Authors: LAN TTN SEIDEL U WALTHER HG GOCH G SCHMITZ B
Citation: Ttn. Lan et al., EXPERIMENTAL RESULTS OF PHOTOTHERMAL MICROSTRUCTURAL DEPTH PROFILING, Journal of applied physics, 78(6), 1995, pp. 4108-4111
AN ATTEMPT TOWARDS QUANTITATIVE PHOTOTHERMAL MICROSCOPY
Authors: SEIDEL U HAUPT K WALTHER HG BURT JA MUNIDASA M
Citation: U. Seidel et al., AN ATTEMPT TOWARDS QUANTITATIVE PHOTOTHERMAL MICROSCOPY, Journal of applied physics, 78(3), 1995, pp. 2050-2056
THEORY OF MICROSTRUCTURAL DEPTH PROFILING BY PHOTOTHERMAL MEASUREMENTS
Authors: LAN TTN SEIDEL U WALTHER HG
Citation: Ttn. Lan et al., THEORY OF MICROSTRUCTURAL DEPTH PROFILING BY PHOTOTHERMAL MEASUREMENTS, Journal of applied physics, 77(9), 1995, pp. 4739-4745
DESCRIPTION OF AN INTERFEROMETRIC PHOTOTHERMAL MICROSCOPE AND ITS APPLICATION TO THE STUDY OF SEMICONDUCTOR SAMPLES
Authors: HAUPT K GLAZOV A WALTHER HG DOPEL E
Citation: K. Haupt et al., DESCRIPTION OF AN INTERFEROMETRIC PHOTOTHERMAL MICROSCOPE AND ITS APPLICATION TO THE STUDY OF SEMICONDUCTOR SAMPLES, Journal de physique. IV, 4(C7), 1994, pp. 11-14
SPATIALLY-RESOLVED PHOTOMODULATED MICROWAVE-ABSORPTION AND THERMAL-WAVE IMAGES OF BORON-DOPED SILICON
Authors: VONGEISAU O MECKENSTOCK R SCHREIBER F PELZL J SEIDEL U WALTHER HG
Citation: O. Vongeisau et al., SPATIALLY-RESOLVED PHOTOMODULATED MICROWAVE-ABSORPTION AND THERMAL-WAVE IMAGES OF BORON-DOPED SILICON, Journal de physique. IV, 4(C7), 1994, pp. 133-136
THERMAL-DIFFUSIVITY DETERMINATION BY THE PHOTODEFLECTION METHOD - THEINFLUENCE OF WAVE OPTICAL EFFECTS
Authors: WALTHER HG MURATIKOV KL GLAZOV AL
Citation: Hg. Walther et al., THERMAL-DIFFUSIVITY DETERMINATION BY THE PHOTODEFLECTION METHOD - THEINFLUENCE OF WAVE OPTICAL EFFECTS, Journal de physique. IV, 4(C7), 1994, pp. 291-294
A PROPOSAL FOR THE RECONSTRUCTION OF BURIED DEFECTS FROM PHOTOTHERMALIMAGES
Authors: SEIDEL U WALTHER HG BURT JA
Citation: U. Seidel et al., A PROPOSAL FOR THE RECONSTRUCTION OF BURIED DEFECTS FROM PHOTOTHERMALIMAGES, Journal de physique. IV, 4(C7), 1994, pp. 551-554
CONDITIONS FOR OPTIMUM PHOTOTHERMAL DISCRIMINATION OF SUBSURFACE THERMAL INHOMOGENEITIES
Authors: SEIDEL U GLAZOV A HAUPT K WALTHER HG BURT J BEIN BK PELZL J
Citation: U. Seidel et al., CONDITIONS FOR OPTIMUM PHOTOTHERMAL DISCRIMINATION OF SUBSURFACE THERMAL INHOMOGENEITIES, Journal de physique. IV, 4(C7), 1994, pp. 555-558
Risultati: 1-25 | 26-28