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Results: 1-17 |
Results: 17
STM OBSERVATIONS OF HYDROGEN-INDUCED PB CLUSTERING ON PB SI(111) SYSTEMS/
Authors: OHBA Y KATAYAMA I WATAMORI M OURA K
Citation: Y. Ohba et al., STM OBSERVATIONS OF HYDROGEN-INDUCED PB CLUSTERING ON PB SI(111) SYSTEMS/, Applied physics A: Materials science & processing, 66, 1998, pp. 1017-1019
STM OBSERVATION OF AG CLUSTERING ON HYDROGEN-TERMINATED SI(100) SURFACES
Authors: OHBA Y KATAYAMA I NUMATA T OHNISHI H WATAMORI M OURA K
Citation: Y. Ohba et al., STM OBSERVATION OF AG CLUSTERING ON HYDROGEN-TERMINATED SI(100) SURFACES, Applied surface science, 121, 1997, pp. 191-194
HIGH-ENERGY ION-BEAM ANALYSIS OF FERROELECTRIC THIN-FILMS
Authors: WATAMORI M HONDA S KUBO O KANNO I HIRAO T SASABE K OURA K
Citation: M. Watamori et al., HIGH-ENERGY ION-BEAM ANALYSIS OF FERROELECTRIC THIN-FILMS, Applied surface science, 117, 1997, pp. 453-458
A NEW METHOD FOR THE DETECTION OF NATIVE-OXIDE ON SI WITH COMBINED USE OF O-16(ALPHA,ALPHA)O-16 RESONANCE AND CHANNELING
Authors: WATAMORI M MAEDA Y KUBO O OURA K
Citation: M. Watamori et al., A NEW METHOD FOR THE DETECTION OF NATIVE-OXIDE ON SI WITH COMBINED USE OF O-16(ALPHA,ALPHA)O-16 RESONANCE AND CHANNELING, Applied surface science, 114, 1997, pp. 403-407
DEPTH PROFILING OF OXYGEN-CONTENT OF INDIUM TIN OXIDE FABRICATED BY BIAS SPUTTERING
Authors: HONDA S CHIHARA K WATAMORI M OURA K
Citation: S. Honda et al., DEPTH PROFILING OF OXYGEN-CONTENT OF INDIUM TIN OXIDE FABRICATED BY BIAS SPUTTERING, Applied surface science, 114, 1997, pp. 408-411
RECONSTRUCTION AND GROWTH OF AG ON HYDROGEN-TERMINATED SI(111) SURFACES
Authors: OHBA Y KATAYAMA I YAMAMOTO Y WATAMORI M OURA K
Citation: Y. Ohba et al., RECONSTRUCTION AND GROWTH OF AG ON HYDROGEN-TERMINATED SI(111) SURFACES, Applied surface science, 114, 1997, pp. 448-452
BACKSCATTERING ANALYSIS OF THIN SIO2-FILMS ON SI USING O-16(ALPHA,ALPHA)O-16 3.045 MEV RESONANCE
Authors: WATAMORI M OURA K HIRAO T SASABE K
Citation: M. Watamori et al., BACKSCATTERING ANALYSIS OF THIN SIO2-FILMS ON SI USING O-16(ALPHA,ALPHA)O-16 3.045 MEV RESONANCE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 228-232
CHANNELING ANALYSIS OF OXYGEN IN OXIDE MATERIALS USING O-16(ALPHA,ALPHA)O-16 RESONANT BACKSCATTERING
Authors: WATAMORI M OURA K HIRAO T SASABE K
Citation: M. Watamori et al., CHANNELING ANALYSIS OF OXYGEN IN OXIDE MATERIALS USING O-16(ALPHA,ALPHA)O-16 RESONANT BACKSCATTERING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 233-237
THE EFFECTS OF OXYGEN-CONTENT ON ELECTRICAL AND OPTICAL-PROPERTIES OFINDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING
Authors: HONDA S WATAMORI M OURA K
Citation: S. Honda et al., THE EFFECTS OF OXYGEN-CONTENT ON ELECTRICAL AND OPTICAL-PROPERTIES OFINDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING, Thin solid films, 282(1-2), 1996, pp. 206-208
EFFECTS OF POSTANNEALING ON OXYGEN-CONTENT OF INDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING
Authors: HONDA S TSUJIMOTO A WATAMORI M OURA K
Citation: S. Honda et al., EFFECTS OF POSTANNEALING ON OXYGEN-CONTENT OF INDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING, JPN J A P 2, 34(10B), 1995, pp. 1386-1389
QUANTITATIVE DEPTH PROFILING OF OXYGEN IN HOMOEPITAXIAL SRTIO3 FILMS
Authors: WATAMORI M OURA K NAKAMURA T
Citation: M. Watamori et al., QUANTITATIVE DEPTH PROFILING OF OXYGEN IN HOMOEPITAXIAL SRTIO3 FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1293-1298
OXYGEN-CONTENT OF INDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING
Authors: HONDA S TSUJIMOTO A WATAMORI M OURA K
Citation: S. Honda et al., OXYGEN-CONTENT OF INDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1100-1103
METHODOLOGY FOR ACCURATE OXYGEN DISTRIBUTION ANALYSIS AND ITS APPLICATION TO YBA2CU3OX THIN-FILMS USING O-16(ALPHA,ALPHA)O-16 3.045-MEV RESONANCE REACTION
Authors: WATAMORI M SHOJI F OURA K
Citation: M. Watamori et al., METHODOLOGY FOR ACCURATE OXYGEN DISTRIBUTION ANALYSIS AND ITS APPLICATION TO YBA2CU3OX THIN-FILMS USING O-16(ALPHA,ALPHA)O-16 3.045-MEV RESONANCE REACTION, JPN J A P 1, 33(10), 1994, pp. 6039-6045
DEPTH PROFILING OF OXYGEN CONCENTRATION OF INDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING
Authors: HONDA S TSUJIMOTO A WATAMORI M OURA K
Citation: S. Honda et al., DEPTH PROFILING OF OXYGEN CONCENTRATION OF INDIUM TIN OXIDE-FILMS FABRICATED BY REACTIVE SPUTTERING, JPN J A P 2, 33(9A), 1994, pp. 120001257-120001260
LOW-TEMPERATURE ADSORPTION OF HYDROGEN ON SI(111) AND (100) SURFACES STUDIED BY ELASTIC RECOIL DETECTION ANALYSIS
Authors: WATAMORI M NAITOH M MORIOKA H MAEDA Y OURA K
Citation: M. Watamori et al., LOW-TEMPERATURE ADSORPTION OF HYDROGEN ON SI(111) AND (100) SURFACES STUDIED BY ELASTIC RECOIL DETECTION ANALYSIS, Applied surface science, 82-3, 1994, pp. 417-421
STRUCTURAL STUDY OF SRTIO3(100) SURFACES BY LOW-ENERGY ION-SCATTERING
Authors: TANAKA Y MORISHITA H WATAMORI M OURA K KATAYAMA I
Citation: Y. Tanaka et al., STRUCTURAL STUDY OF SRTIO3(100) SURFACES BY LOW-ENERGY ION-SCATTERING, Applied surface science, 82-3, 1994, pp. 528-531
ELASTIC RECOIL DETECTION ANALYSIS OF COADSORPTION OF HYDROGEN AND DEUTERIUM ON CLEAN SI SURFACES
Authors: OURA K NAITOH M MORIOKA H WATAMORI M SHOJI F
Citation: K. Oura et al., ELASTIC RECOIL DETECTION ANALYSIS OF COADSORPTION OF HYDROGEN AND DEUTERIUM ON CLEAN SI SURFACES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85(1-4), 1994, pp. 344-346
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