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DAVIS GA
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Citation: Rl. Jiang et al., SIGE GE HETEROJUNCTION INFRARED DETECTOR, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 15(3), 1997, pp. 968-970
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Citation: B. Shen et al., ELECTRICAL-ACTIVITY OF FRANK PARTIAL DISLOCATIONS AND THE INFLUENCE OF METALLIC IMPURITIES IN CZOCHRALSKI-GROWN SILICON, Chinese Physics Letters, 14(6), 1997, pp. 436-439
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JIANG N
GU SL
LI Z
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ZHENG YD
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ZHANG XY
YANG K
CHEN P
ZHANG R
SHI Y
ZHENG YD
SEKIGUCHI T
SUMINO K
Citation: B. Shen et al., GETTERING OF FE IMPURITIES BY BULK STACKING-FAULTS IN CZOCHRALSKI-GROWN SILICON, Applied physics letters, 70(14), 1997, pp. 1876-1878
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CHEN H
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WANG RH
ZHU SM
FENG D
Citation: Xd. Huang et al., HIGH PHOSPHORUS DOPING OF EPITAXIAL SILICON AT LOW-TEMPERATURE AND VERY-LOW PRESSURE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(4), 1996, pp. 2690-2692