Authors:
Dinescu, G
de Graaf, A
Aldea, E
van de Sanden, MCM
Citation: G. Dinescu et al., Investigation of processes in low-pressure expanding thermal plasmas used for carbon nitride deposition: 1. Ar/N-2/C2H2 plasma, PLASMA SOUR, 10(3), 2001, pp. 513-523
Authors:
de Graaf, A
Aldea, E
Dinescu, G
van de Sanden, MCM
Citation: A. De Graaf et al., Investigation of processes in low-pressure expanding thermal plasmas used for carbon nitride deposition: II. Ar/N-2 plasma with graphite nozzle, PLASMA SOUR, 10(3), 2001, pp. 524-529
Authors:
Kessels, WMM
Boogaarts, MGH
Hoefnagels, JPM
Schram, DC
van de Sanden, MCM
Citation: Wmm. Kessels et al., Improvement of hydrogenated amorphous silicon properties with increasing contribution of SiH3 to film growth, J VAC SCI A, 19(3), 2001, pp. 1027-1029
Authors:
Kessels, WMM
Leroux, A
Boogaarts, MGH
Hoefnagels, JPM
van de Sanden, MCM
Schram, DC
Citation: Wmm. Kessels et al., Cavity ring down detection of SiH3 in a remote SiH4 plasma and comparison with model calculations and mass spectrometry, J VAC SCI A, 19(2), 2001, pp. 467-476
Authors:
Groenen, R
Linden, JL
van Lierop, HRM
Schram, DC
Kuypers, AD
van de Sanden, MCM
Citation: R. Groenen et al., An expanding thermal plasma for deposition of surface textured ZnO : Al with focus on thin film solar cell applications, APPL SURF S, 173(1-2), 2001, pp. 40-43
Authors:
Groenen, R
Loffler, J
Sommeling, PM
Linden, JL
Hamers, EAG
Schropp, REI
van de Sanden, MCM
Citation: R. Groenen et al., Surface textured ZnO films for thin film solar cell applications by expanding thermal plasma CVD, THIN SOL FI, 392(2), 2001, pp. 226-230
Authors:
Kessels, WMM
Hoefnagels, JPM
Boogaarts, MGH
Schram, DC
van de Sanden, MCM
Citation: Wmm. Kessels et al., Cavity ring down study of the densities and kinetics of Si and SiH in a remote Ar-H-2-SiH4 plasma, J APPL PHYS, 89(4), 2001, pp. 2065-2073
Authors:
Kessels, WMM
Severens, RJ
Smets, AHM
Korevaar, BA
Adriaenssens, GJ
Schram, DC
van de Sanden, MCM
Citation: Wmm. Kessels et al., Hydrogenated amorphous silicon deposited at very high growth rates by an expanding Ar-H-2-SiH4 plasma, J APPL PHYS, 89(4), 2001, pp. 2404-2413
Authors:
van Hest, MFAM
de Graaf, A
van de Sanden, MCM
Schram, DC
Citation: Mfam. Van Hest et al., Use of in situ FTIR spectroscopy and mass spectrometry in an expanding hydrocarbon plasma, PLASMA SOUR, 9(4), 2000, pp. 615-624
Authors:
Dementjev, AP
de Graaf, A
van de Sanden, MCM
Maslakov, KI
Naumkin, AV
Serov, AA
Citation: Ap. Dementjev et al., X-ray photoelectron spectroscopy reference data for identification of the C3N4 phase in carbon-nitrogen films, DIAM RELAT, 9(11), 2000, pp. 1904-1907
Authors:
Kessels, WMM
van de Sanden, MCM
Schram, DC
Citation: Wmm. Kessels et al., Film growth precursors in a remote SiH4 plasma used for high-rate deposition of hydrogenated amorphous silicon, J VAC SCI A, 18(5), 2000, pp. 2153-2163
Authors:
Korevaar, BA
Adriaenssens, GJ
Smets, AHM
Kessels, WMM
Song, HZ
van de Sanden, MCM
Schram, DC
Citation: Ba. Korevaar et al., High hole drift mobility in a-Si : H deposited at high growth rates for solar cell application, J NON-CRYST, 266, 2000, pp. 380-384
Citation: Ahm. Smets et al., In situ single wavelength ellipsometry studies of high rate hydrogenated amorphous silicon growth using a remote expanding thermal plasma, J APPL PHYS, 88(11), 2000, pp. 6388-6394
Authors:
Leroux, A
Kessels, WMM
Schram, DC
van de Sanden, MCM
Citation: A. Leroux et al., Modeling of the formation of cationic silicon clusters in a remote Ar/H-2/SiH4 plasma, J APPL PHYS, 88(1), 2000, pp. 537-543
Authors:
Kessels, WMM
van de Sanden, MCM
Severens, RJ
Schram, DC
Citation: Wmm. Kessels et al., Surface reaction probability during fast deposition of hydrogenated amorphous silicon with a remote silane plasma, J APPL PHYS, 87(7), 2000, pp. 3313-3320
Authors:
Boogaarts, MGH
Bocker, PJ
Kessels, WMM
Schram, DC
van de Sanden, MCM
Citation: Mgh. Boogaarts et al., Cavity ring down detection of SiH3 on the broadband (A)over-tilde (2)A '(1) <- (X)over-tilde (2)A(1) transition in a remote Ar-H-2-SiH4 plasma, CHEM P LETT, 326(5-6), 2000, pp. 400-406
Authors:
van de Sanden, MCM
van Hest, MFAM
de Graaf, A
Smets, AHM
Letourneur, KGY
Boogaarts, MGH
Schram, DC
Citation: Mcm. Van De Sanden et al., Plasma chemistry of an expanding Ar/C2H2 plasma used for fast deposition of a-C : H, DIAM RELAT, 8(2-5), 1999, pp. 677-681
Authors:
van de Sanden, MCM
Kessels, WMM
Severens, RJ
Schram, DC
Citation: Mcm. Van De Sanden et al., Plasma and surface chemistry effects during high rate deposition of hydrogenated amorphous silicon, PLASMA PHYS, 41, 1999, pp. A365-A378
Authors:
Kessels, WMM
Leewis, CM
van de Sanden, MCM
Schram, DC
Citation: Wmm. Kessels et al., Formation of cationic silicon clusters in a remote silane plasma and theircontribution to hydrogenated amorphous silicon film growth, J APPL PHYS, 86(7), 1999, pp. 4029-4039
Authors:
van de Sanden, MCM
Severens, RJ
Kessels, WMM
Meulenbroeks, RFG
Schram, DC
Citation: Mcm. Van De Sanden et al., Plasma chemistry aspects of a-Si : H deposition using an expanding thermalplasma (vol 84, pg 2426, 1998), J APPL PHYS, 85(2), 1999, pp. 1243-1243