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Citation: V. Solberg, Board level reliability testing of mu BGA (R) packaging with lead-free solder attachment, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 10-14
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Cada, LG
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Citation: R. Aschenbrenner et al., A new approach for system integrated packaging, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 41-45
Citation: V. Szekely et al., New hardware tools for the thermal transient testing of packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 46-52
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Cheah, TS
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Ghulam, AQ
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Citation: Ts. Cheah et al., Numerical modeling of microscale heat conduction effects in electronic package for different thermal boundary conditions, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 53-59
Authors:
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Chuan, TK
Jin, WX
Citation: Mk. Khan, N",pinjala,"iyer et al., Thermal enhancement of desk top computer by chassis design optimization, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 60-64
Citation: Cf. Chan et al., An intermetallic study of solder joints with Sn-Ag-Cu lead-free solder, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 72-80
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Citation: Xj. Huang et al., Experimental characterization for the shear strength of Pb-free solder balls on a PZT substrate with Pd/Ag pads, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 86-90
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Ohnuma, I
Liu, XJ
Ohtani, H
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Citation: I. Ohnuma et al., Development of thermodynamic database for micro-soldering alloys, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 91-96
Citation: C. Bailey et al., Predicting the movement of voids in solder bumps and subsequent reliability, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 97-102
Citation: Kn. Chiang et al., Analysis of ACA/ACF package using equivalent spring method, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 110-116
Citation: W. Dreyer et Wh. Muller, Quantitative modeling of diffusional coarsening in eutectic tin/lead solders, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 117-123
Authors:
Long, TK
Li, GM
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Citation: Tk. Long et al., A fresh look at thermal resistance in electronic packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 124-130
Citation: Cv. Loh et al., Development of effective compact models for depopulated ball grid array packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 131-137
Authors:
Parthiban, A
Jeevan, K
Seetharamu, KN
Azid, IA
Citation: A. Parthiban et al., Evolutionary genetic approach to determine junction temperature in electronic packages, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 138-143
Citation: D. Pinjala et al., Thermal characterization of vias using compact models, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 144-147
Authors:
Zhu, H
Guo, YF
Li, WY
Tseng, AA
Martin, B
Citation: H. Zhu et al., Micro-mechanical characterization of solder mask materials, PROCEEDINGS OF 3RD ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, 2000, pp. 148-153