Citation: J. Blochwitz et al., LOW-VOLTAGE ORGANIC LIGHT-EMITTING-DIODES FEATURING DOPED PHTHALOCYANINE AS HOLE TRANSPORT MATERIAL, Applied physics letters, 73(6), 1998, pp. 729-731
Authors:
CABRERA B
CLARKE RM
COLLING P
MILLER AJ
NAM S
ROMANI RW
Citation: B. Cabrera et al., DETECTION OF SINGLE INFRARED, OPTICAL, AND ULTRAVIOLET PHOTONS USING SUPERCONDUCTING TRANSITION EDGE SENSORS, Applied physics letters, 73(6), 1998, pp. 735-737
Citation: Y. Ding et al., FREQUENCY-DOUBLING IN GALLIUM-LANTHANUM-SULFIDE GLASS WITH SURFACE CRYSTALLIZED GA6LA10 3S14 THIN-FILMS/, Applied physics letters, 73(6), 1998, pp. 738-740
Citation: A. Inoue et al., FERROMAGNETIC CO-FE-ZR-B AMORPHOUS-ALLOYS WITH GLASS-TRANSITION AND GOOD HIGH-FREQUENCY PERMEABILITY, Applied physics letters, 73(6), 1998, pp. 744-746
Authors:
MARCHAND H
WU XH
IBBETSON JP
FINI PT
KOZODOY P
KELLER S
SPECK JS
DENBAARS SP
MISHRA UK
Citation: H. Marchand et al., MICROSTRUCTURE OF GAN LATERALLY OVERGROWN BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION, Applied physics letters, 73(6), 1998, pp. 747-749
Citation: D. Maroudas et al., KINETICS OF STRAIN RELAXATION THROUGH MISFIT DISLOCATION FORMATION INTHE GROWTH OF EPITAXIAL-FILMS ON COMPLIANT SUBSTRATES, Applied physics letters, 73(6), 1998, pp. 753-755
Citation: M. Reichling et al., LOCAL VARIATION OF ROOM-TEMPERATURE THERMAL-CONDUCTIVITY IN HIGH-QUALITY POLYCRYSTALLINE DIAMOND, Applied physics letters, 73(6), 1998, pp. 756-758
Citation: Jh. Han et al., EFFECTS OF PRECIPITATE DISTRIBUTION ON ELECTROMIGRATION IN AL-CU THIN-FILM INTERCONNECTS, Applied physics letters, 73(6), 1998, pp. 762-764
Citation: M. Nishitanigamo et al., CONFOCAL RAMAN-SPECTROSCOPIC OBSERVATION OF HEXAGONAL DIAMOND FORMATION FROM DISSOLVED CARBON IN NICKEL UNDER CHEMICAL-VAPOR-DEPOSITION CONDITIONS, Applied physics letters, 73(6), 1998, pp. 765-767
Authors:
KAWAI S
OGAWA T
LEE HS
DEMATTEI RC
FEIGELSON RS
Citation: S. Kawai et al., 2ND-HARMONIC GENERATION FROM NEEDLE-LIKE FERROELECTRIC DOMAINS IN SR0.6BA0.4ND2O6 SINGLE-CRYSTALS, Applied physics letters, 73(6), 1998, pp. 768-770
Authors:
ZIMMERMANN L
DENIJS JMM
ALKEMADE PFA
WESTERDUIN K
VANVEEN A
Citation: L. Zimmermann et al., EFFECT OF THE SILICON TOP LAYER OF SILICON IMPLANTED WITH OXYGEN ON THE UPTAKE AND RELEASE OF DEUTERIUM BY THE BURIED OXIDE, Applied physics letters, 73(6), 1998, pp. 774-776
Authors:
SCHAFER J
YOUNG AP
BRILLSON LJ
NIIMI H
LUCOVSKY G
Citation: J. Schafer et al., DEPTH-DEPENDENT SPECTROSCOPIC DEFECT CHARACTERIZATION OF THE INTERFACE BETWEEN PLASMA-DEPOSITED SIO2 AND SILICON, Applied physics letters, 73(6), 1998, pp. 791-793
Citation: N. Okamoto et al., NONALLOYED OHMIC CONTACT TO N-GAAS WITH GAS GAAS QUASI-METAL-INSULATOR-SEMICONDUCTOR STRUCTURE/, Applied physics letters, 73(6), 1998, pp. 794-796
Citation: C. Youtsey et al., GALLIUM NITRIDE WHISKERS FORMED BY SELECTIVE PHOTOENHANCED WET ETCHING OF DISLOCATIONS, Applied physics letters, 73(6), 1998, pp. 797-799
Authors:
MAIMON S
COHEN GM
FINKMAN E
BAHIR G
RITTER D
SCHACHAM SE
Citation: S. Maimon et al., STRAIN COMPENSATED INGAAS INGAP QUANTUM-WELL INFRARED DETECTOR FOR MIDWAVELENGTH BAND DETECTION/, Applied physics letters, 73(6), 1998, pp. 800-802