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Results: 226-250/544
Authors:
FUJISAWA H
SHIMIZU M
SHIOSAKI T
Citation: H. Fujisawa et al., CHARACTERIZATION OF PB(ZR,TI)O-3 THIN-FILMS BY MOCVD USING THE TOTAL-REFLECTION X-RAY-DIFFRACTION METHOD, Integrated ferroelectrics, 15(1-4), 1997, pp. 1-8
Authors:
DEY SK
MELNICK BM
TAYLOR DJ
Citation: Sk. Dey et al., PROCEEDINGS OF THE 8TH INTERNATIONAL-SYMPOSIUM ON INTEGRATED FERROELECTRICS - TEMPE, ARIZONA, USA - MARCH 18-20, 1996 .2., Integrated ferroelectrics, 15(1-4), 1997, pp. 7-8
Authors:
WEBB JD
MOUTINHO HR
KAZMERSKI LL
MUELLER CH
RIVKIN TV
TREECE RE
DALBERTH M
ROGERS CT
Citation: Jd. Webb et al., INFRARED SPECTROSCOPIC, X-RAY, AND NANOSCALE CHARACTERIZATION OF STRONTIUM-TITANATE THIN-FILMS, Integrated ferroelectrics, 15(1-4), 1997, pp. 9-18
Authors:
WILLEMS GJ
WOUTERS DJ
MAES HE
NOUWEN R
Citation: Gj. Willems et al., NUCLEATION AND ORIENTATION OF SOL-GEL PZT-FILMS ON PT ELECTRODES, Integrated ferroelectrics, 15(1-4), 1997, pp. 19-28
Authors:
BENEDETTO JM
Citation: Jm. Benedetto, IMPRINT INDUCED FAILURE MODES IN FERROELECTRIC NONVOLATILE MEMORIES, Integrated ferroelectrics, 15(1-4), 1997, pp. 29-38
Authors:
WASER R
Citation: R. Waser, DIELECTRIC ANALYSIS OF INTEGRATED CERAMIC THIN-FILM CAPACITORS, Integrated ferroelectrics, 15(1-4), 1997, pp. 39-51
Authors:
ALSHAREEF HN
DIMOS D
WARREN WL
TUTTLE BA
Citation: Hn. Alshareef et al., A MODEL FOR OPTICAL AND ELECTRICAL-POLARIZATION FATIGUE IN SRBI2TA2O9AND PB(ZR,TI)O-3, Integrated ferroelectrics, 15(1-4), 1997, pp. 53-67
Authors:
NOMA A
UEDA D
Citation: A. Noma et D. Ueda, RELIABILITY STUDY ON BST CAPACITORS FOR GAAS MMIC, Integrated ferroelectrics, 15(1-4), 1997, pp. 69-78
Authors:
WOUTERS DJ
WILLEMS G
LEE EG
MAES HE
Citation: Dj. Wouters et al., ELUCIDATION OF THE SWITCHING PROCESSES IN TETRAGONAL PZT BY HYSTERESIS LOOP AND IMPEDANCE ANALYSIS, Integrated ferroelectrics, 15(1-4), 1997, pp. 79-87
Authors:
CHEN HD
UDAYAKUMAR KR
GASKEY CJ
CROSS LE
Citation: Hd. Chen et al., DIELECTRIC-BREAKDOWN STRENGTH IN SOL-GEL DERIVED PZT THICK-FILMS, Integrated ferroelectrics, 15(1-4), 1997, pp. 89-98
Authors:
TAHAN DM
SAFARI A
KLEIN LC
Citation: Dm. Tahan et al., PROCESSING AND DIELECTRIC-PROPERTIES OF SOL-GEL DERIVED BST THIN-FILMS, Integrated ferroelectrics, 15(1-4), 1997, pp. 99-106
Authors:
AUCIELLO O
GRUVERMAN A
TOKUMOTO H
Citation: O. Auciello et al., SCANNING FORCE MICROSCOPY STUDY OF DOMAIN-STRUCTURE IN PB(ZRXTI1-X)O-3 THIN-FILMS AND PT PZT/PT AND RUO2/PZT/RUO2 CAPACITORS/, Integrated ferroelectrics, 15(1-4), 1997, pp. 107-114
Authors:
LEE JK
SONG TK
JUNG HJ
Citation: Jk. Lee et al., CHARACTERISTICS OF SRBI2TA2O9 THIN-FILMS FABRICATED BY THE RF MAGNETRON SPUTTERING TECHNIQUE, Integrated ferroelectrics, 15(1-4), 1997, pp. 115-125
Authors:
HASE T
NOGUCHI T
AMANUMA K
MIYASAKA Y
Citation: T. Hase et al., SR CONTENT DEPENDENCE OF FERROELECTRIC PROPERTIES IN SRBI2TA2O9 THIN-FILMS, Integrated ferroelectrics, 15(1-4), 1997, pp. 127-135
Authors:
TOKUMITSU E
SHIMAMURA T
ISHIWARA H
Citation: E. Tokumitsu et al., ELECTRICAL-PROPERTIES OF FERROELECTRIC-CAPACITOR-GATE SI MOS-TRANSISTORS USING P(L)ZT FILMS, Integrated ferroelectrics, 15(1-4), 1997, pp. 137-144
Authors:
FINDER J
MELNICK BM
ABROKWAH J
OOMS B
Citation: J. Finder et al., STATISTICAL INVESTIGATION OF DIELECTRIC-BREAKDOWN OF BISMUTH TANTALATE THIN-FILM CAPACITORS, Integrated ferroelectrics, 15(1-4), 1997, pp. 145-154
Authors:
OBRYAN HM
WATTS RK
HOU S
MA ZX
Citation: Hm. Obryan et al., GROWTH AND CHARACTERIZATION OF THIN-FILM DIELECTRICS FOR MICROWAVE APPLICATIONS, Integrated ferroelectrics, 15(1-4), 1997, pp. 155-162
Authors:
FINDIKOGLU AT
JIA QX
WU XD
REAGOR DW
Citation: At. Findikoglu et al., PARAELECTRIC THIN-FILMS FOR MICROWAVE APPLICATIONS, Integrated ferroelectrics, 15(1-4), 1997, pp. 163-171
Authors:
KNAUSS LA
HORWITZ JS
POND JM
KIRCHOEFER SW
CHRISEY DB
MUELLER CH
TREECE R
Citation: La. Knauss et al., DIELECTRIC-PROPERTIES OF SRTIO3 THIN-FILMS WITH CA AND ZR PARTIAL SUBSTITUTIONS FOR ACTIVE MICROWAVE APPLICATIONS, Integrated ferroelectrics, 15(1-4), 1997, pp. 173-180
Authors:
SENGUPTA LC
NGO E
SYNOWCZYNSKI J
Citation: Lc. Sengupta et al., FABRICATION AND CHARACTERIZATION OF FERROELECTRIC COMPOSITE CERAMICS, Integrated ferroelectrics, 15(1-4), 1997, pp. 181-190
Authors:
GRZECHNIK A
HUBERT H
MCMILLAN P
PETUSKEY W
Citation: A. Grzechnik et al., SRGEO3-SRTIO3 PEROVSKITES - HIGH-PRESSURE SYNTHESIS, STRUCTURE, AND DIELECTRIC-PROPERTIES, Integrated ferroelectrics, 15(1-4), 1997, pp. 191-198
Authors:
JONES RE
ZURCHER P
CHU P
TAYLOR DJ
ZAFAR S
JIANG B
GILLESPIE SJ
Citation: Re. Jones et al., PERFORMANCE OF SRBI2TA2O9 FOR LOW-VOLTAGE, NONVOLATILE MEMORY APPLICATIONS, Integrated ferroelectrics, 15(1-4), 1997, pp. 199-210
Authors:
AUCIELLO O
Citation: O. Auciello, A CRITICAL COMPARATIVE REVIEW OF PZT AND SBT-BASED SCIENCE AND TECHNOLOGY FOR NONVOLATILE FERROELECTRIC MEMORIES, Integrated ferroelectrics, 15(1-4), 1997, pp. 211-220
Authors:
MELNICK BM
ABROKWAH J
HALLMARK J
OOMS B
Citation: Bm. Melnick et al., BISMUTH-BASED LAYERED PEROVSKITE THIN-FILMS AS A CHARGE STORAGE MATERIAL FOR LOW-POWER NONVOLATILE GAAS MEMORY APPLICATIONS, Integrated ferroelectrics, 15(1-4), 1997, pp. 221-233
Authors:
JAMMY R
WILLS LA
Citation: R. Jammy et La. Wills, HIGH-FREQUENCY ELECTRICAL CHARACTERIZATION OF BST CAPACITORS, Integrated ferroelectrics, 15(1-4), 1997, pp. 235-243