AAAAAA
Results: 101-125/520
Authors:
Leneke, W
Schieferdecker, J
Storck, K
Simon, M
Citation: W. Leneke et al., Linear and matrix thermopile sensor arrays for detection of position, presence, and movement, TEC MES, 66(3), 1999, pp. 104-108
Authors:
Zimmerhackl, M
Nagel, F
Budzier, H
Hofmann, G
Citation: M. Zimmerhackl et al., Non-contact temperature measurement systems for industrial processes, TEC MES, 66(3), 1999, pp. 109-115
Authors:
Tank, V
Citation: V. Tank, Radiometric calibration of IR spectrometers for hot gas remote sensing, TEC MES, 66(3), 1999, pp. 116-121
Authors:
Czaske, M
Citation: M. Czaske, Measuring submicrometer structures near the limit of resolution of opticalmicroscopy, TEC MES, 66(2), 1999, pp. 43-49
Authors:
Stange, G
Citation: G. Stange, A new method of flow measurement for non conducting fluids, TEC MES, 66(2), 1999, pp. 50-53
Authors:
Schupp, D
Citation: D. Schupp, Optical tensor field tomography to investigate 3D stress distributions, TEC MES, 66(2), 1999, pp. 54-60
Authors:
Glitza, O
Becker, WJ
Citation: O. Glitza et Wj. Becker, A new approach to the non-invasive measurement of the mass density of liquids by means of ultrasonic waves, TEC MES, 66(2), 1999, pp. 61-69
Authors:
Steinchen, W
Kupfer, G
Mackel, P
Vossing, F
Citation: W. Steinchen et al., Digital shearographic vibration analysis of harmonically excited components, TEC MES, 66(2), 1999, pp. 70-77
Authors:
Hasche, K
Wilkening, G
Citation: K. Hasche et G. Wilkening, Microsystems metrology, TEC MES, 66(12), 1999, pp. 475-475
Authors:
Gatzen, HH
Citation: Hh. Gatzen, Micro electro-mechanical systems (MEMS) in precision engineering, TEC MES, 66(12), 1999, pp. 476-484
Authors:
Schwenke, H
Weiskirch, C
Kunzmann, H
Citation: H. Schwenke et al., Opto-tactile sensor for 2D-and 3D measurement of small structures on coordinate-measuring machines, TEC MES, 66(12), 1999, pp. 485-489
Authors:
Kleine-Besten, T
Loheide, S
Brand, U
Schlachetzki, A
Butefisch, S
Buttgenbach, S
Citation: T. Kleine-besten et al., 3D probe for dimensional metrology on microsystem components, TEC MES, 66(12), 1999, pp. 490-495
Authors:
Brand, U
Hinzmann, G
Schnadelbach, H
Feist, C
Stuht, P
Kruger-Sehm, R
Jager, V
Citation: U. Brand et al., Traceable and precise depth setting standards for measurement ranges from 1 mu m to 1 mm, TEC MES, 66(12), 1999, pp. 496-503
Authors:
Buchner, H
Jager, G
Gerhardt, U
Ilmenau, TU
Hasche, K
Citation: H. Buchner et al., Development of a 3D-laserinterferometric nano-measuring-system for Abbe-error-free fitting into scanning force microscopes, TEC MES, 66(12), 1999, pp. 504-510
Authors:
Herrmann, K
Hasche, K
Seemann, R
Citation: K. Herrmann et al., Measurement of indenters with a scanning force microscope, TEC MES, 66(12), 1999, pp. 511-517
Authors:
Osten, W
Citation: W. Osten, Analysis and modeling of technical surfaces with combinative laser metrology, TEC MES, 66(11), 1999, pp. 411-412
Authors:
Osten, W
Andra, P
Kayser, D
Citation: W. Osten et al., Highly-resolved measurement of extended technical surfaces with scalable topometry, TEC MES, 66(11), 1999, pp. 413-428
Authors:
Tiziani, HJ
Windecker, R
Wegner, M
Leonhardt, K
Steudle, D
Fleischer, M
Citation: Hj. Tiziani et al., Measurement and description of microstructures with consideration of material-specific characteristics, TEC MES, 66(11), 1999, pp. 429-436
Authors:
Duparre, A
Notni, G
Recknagel, RJ
Feigl, T
Gliech, S
Citation: A. Duparre et al., High resolution topometry in conjunction with macro structures, TEC MES, 66(11), 1999, pp. 437-446
Authors:
Jennewein, H
Ganz, T
Gottschling, H
Tschudi, T
Citation: H. Jennewein et al., High-precision optical profilometry at surfaces with varying materials, TEC MES, 66(11), 1999, pp. 447-454
Authors:
Holzapfel, W
Neuschaefer-Rube, U
Doberitzsch, J
Wirth, F
Citation: W. Holzapfel et al., Precise structure measurement using laser-based microellipsometry, TEC MES, 66(11), 1999, pp. 455-462
Authors:
Fricke-Begemann, T
Gulker, G
Hinsch, KD
Wolff, K
Citation: T. Fricke-begemann et al., Analysis of surface processes by means of speckle-correlation, TEC MES, 66(11), 1999, pp. 463-469
Authors:
Czarske, J
Zellmer, H
Plamann, K
Welling, H
Citation: J. Czarske et al., Application of diode-pumped fiber lasers for laser Doppler anemometry, TEC MES, 66(10), 1999, pp. 363-371
Authors:
Uelschen, M
Weidenfeller, J
Lawerenz, M
Citation: M. Uelschen et al., Application of neural networks to fluid measurements with a five-hole probe, TEC MES, 66(10), 1999, pp. 372-377
Authors:
Gatke, J
Citation: J. Gatke, Flow measurement according to the acoustical transit time method at disturbed profiles in cylindric tubes, TEC MES, 66(10), 1999, pp. 378-385