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Results: 1-25/62
Authors:
AUCIELLO O
Citation: O. Auciello, PROCEEDINGS OF THE 10TH INTERNATIONAL-SYMPOSIUM ON INTEGRATED FERROELECTRICS - MONTEREY, CALIFORNIA, USA MARCH 1-4, 1998 - PART II, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 19-29
Authors:
IM J
KRAUSS AR
AUCIELLO O
GRUEN DM
CHANG RPH
Citation: J. Im et al., MASS-SPECTROSCOPY OF RECOILED ION INVESTIGATION OF ELECTRODE SEGREGATION EFFECTS DURING THE INITIAL-STAGES OF SRBI2TA2O9 FILM GROWTH, Integrated ferroelectrics (Print), 22(1-4), 1998, pp. 743-755
Authors:
AUCIELLO O
Citation: O. Auciello, PROCEEDINGS OF THE 10TH INTERNATIONAL-SYMPOSIUM ON INTEGRATED FERROELECTRICS - MONTEREY, CALIFORNIA, USA - MARCH 1-4, 1998, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 11-21
Authors:
BAI GR
WANG A
TSU IF
FOSTER CM
AUCIELLO O
Citation: Gr. Bai et al., IN-SITU LOW-TEMPERATURE GROWTH AND ORIENTATION CONTROL IN MOCVD PZT RUO2 THIN-FILM HETEROSTRUCTURES ON SIO2/SI SUBSTRATES/, Integrated ferroelectrics (Print), 21(1-4), 1998, pp. 291-304
Authors:
GRUVERMAN A
AUCIELLO O
TOKUMOTO H
Citation: A. Gruverman et al., SCANNING FORCE MICROSCOPY - APPLICATION TO NANOSCALE STUDIES OF FERROELECTRIC DOMAINS, Integrated ferroelectrics, 19(1-4), 1998, pp. 49-83
Authors:
KRAUSS AR
IM J
SMENTKOWSKI V
SCHULTZ J
AUCIELLO O
GRUEN DM
HOLOCEK J
CHANG RPH
Citation: Ar. Krauss et al., ION-BEAM DEPOSITION AND SURFACE CHARACTERIZATION OF THIN MULTICOMPONENT OXIDE-FILMS DURING GROWTH, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 253(1-2), 1998, pp. 221-233
Authors:
AUCIELLO O
GRUVERMAN A
TOKUMOTO H
PRAKASH SA
AGGARWAL S
RAMESH R
Citation: O. Auciello et al., NANOSCALE SCANNING FORCE IMAGING OF POLARIZATION PHENOMENA IN FERROELECTRIC THIN-FILMS, MRS bulletin, 23(1), 1998, pp. 33-42
Authors:
AUCIELLO O
RAMESH R
Citation: O. Auciello et R. Ramesh, METAL-OXIDES, Annual review of materials science, 28, 1998, pp. 11-13
Authors:
GRUVERMAN A
AUCIELLO O
TOKUMOTO H
Citation: A. Gruverman et al., IMAGING AND CONTROL OF DOMAIN-STRUCTURES IN FERROELECTRIC THIN-FILMS VIA SCANNING FORCE MICROSCOPY, Annual review of materials science, 28, 1998, pp. 101-123
Authors:
AUCIELLO O
KRAUSS AR
IM J
SCHULTZ JA
Citation: O. Auciello et al., STUDIES OF MULTICOMPONENT OXIDE-FILMS AND LAYERED HETEROSTRUCTURE GROWTH-PROCESSES VIA IN-SITU, TIME-OF-FLIGHT ION-SCATTERING AND DIRECT RECOIL SPECTROSCOPY, Annual review of materials science, 28, 1998, pp. 375-396
Authors:
AUCIELLO O
FOSTER CM
RAMESH R
Citation: O. Auciello et al., PROCESSING TECHNOLOGIES FOR FERROELECTRIC THIN-FILMS AND HETEROSTRUCTURES, Annual review of materials science, 28, 1998, pp. 501-531
Authors:
MICHAELIS A
IRENE EA
AUCIELLO O
KRAUSS AR
VEAL B
Citation: A. Michaelis et al., A SPECTROSCOPIC ANISOTROPY ELLIPSOMETRY STUDY OF YBA2CU3O7-X SUPERCONDUCTORS, Thin solid films, 313, 1998, pp. 362-367
Authors:
AUCIELLO O
SCOTT JF
RAMESH R
Citation: O. Auciello et al., THE PHYSICS OF FERROELECTRIC MEMORIES, Physics today, 51(7), 1998, pp. 22-27
Authors:
AUCIELLO O
RAMESH R
Citation: O. Auciello et R. Ramesh, NVFRAMS STORY SPURS VOLATILE DEBATE ABOUT PHYSICS, APPLICATIONS - AUCIELLO AND RAMESH REPLY, Physics today, 51(11), 1998, pp. 84
Authors:
MICHAELIS A
IRENE EA
AUCIELLO O
KRAUSS AR
Citation: A. Michaelis et al., A STUDY OF OXYGEN DIFFUSION IN AND OUT OF YBA2CU3O7-DELTA THIN-FILMS, Journal of applied physics, 83(12), 1998, pp. 7736-7743
Authors:
MUNKHOLM A
THOMPSON C
FOSTER CM
EASTMAN JA
AUCIELLO O
STEPHENSON GB
FINI P
DENBAARS SP
SPECK JS
Citation: A. Munkholm et al., DETERMINATION OF THE CUBIC TO HEXAGONAL FRACTION IN GAN NUCLEATION LAYERS USING GRAZING-INCIDENCE X-RAY-SCATTERING, Applied physics letters, 72(23), 1998, pp. 2972-2974
Authors:
IM J
KRAUSS AR
DHOTE AM
GRUEN DM
AUCIELLO O
RAMESH R
CHANG RPH
Citation: J. Im et al., STUDIES OF METALLIC SPECIES AND OXYGEN INCORPORATION DURING SPUTTER-DEPOSITION OF SRBI2TA2O9 FILMS, USING MASS-SPECTROSCOPY OF RECOILED IONS, Applied physics letters, 72(20), 1998, pp. 2529-2531
Authors:
KRAUSS AR
AUCIELLO O
IM J
SMENTKOWSKI V
GRUEN DM
IRENE EA
CHANG RPH
Citation: Ar. Krauss et al., STUDIES OF FERROELECTRIC FILM GROWTH-PROCESSES USING IN-SITU, REAL-TIME ION-BEAM ANALYSIS, Integrated ferroelectrics, 18(1-4), 1997, pp. 351-368
Authors:
AUCIELLO O
GRUVERMAN A
TOKUMOTO H
Citation: O. Auciello et al., SCANNING FORCE MICROSCOPY STUDY OF DOMAIN-STRUCTURE IN PB(ZRXTI1-X)O-3 THIN-FILMS AND PT PZT/PT AND RUO2/PZT/RUO2 CAPACITORS/, Integrated ferroelectrics, 15(1-4), 1997, pp. 107-114
Authors:
AUCIELLO O
Citation: O. Auciello, A CRITICAL COMPARATIVE REVIEW OF PZT AND SBT-BASED SCIENCE AND TECHNOLOGY FOR NONVOLATILE FERROELECTRIC MEMORIES, Integrated ferroelectrics, 15(1-4), 1997, pp. 211-220
Authors:
THOMAS D
KINGON AI
AUCIELLO O
WASER R
SCHUMACHER M
Citation: D. Thomas et al., PULSED-LASER ABLATION SYNTHESIS AND CHARACTERIZATION OF LAYERED SRBI2TA2O9 FILMS AND INTEGRATION INTO CAPACITORS FOR NONVOLATILE MEMORIES, Integrated ferroelectrics, 14(1-4), 1997, pp. 51-57
Authors:
GRUVERMAN A
AUCIELLO O
RAMESH R
TOKUMOTO H
Citation: A. Gruverman et al., SCANNING FORCE MICROSCOPY OF DOMAIN-STRUCTURE IN FERROELECTRIC THIN-FILMS - IMAGING AND CONTROL, Nanotechnology, 8, 1997, pp. 38-43
Authors:
GRUVERMAN A
TOKUMOTO H
PRAKASH AS
AGGARWAL S
YANG B
WUTTIG M
RAMESH R
AUCIELLO O
VENKATESAN T
Citation: A. Gruverman et al., NANOSCALE IMAGING OF DOMAIN DYNAMICS AND RETENTION IN FERROELECTRIC THIN-FILMS, Applied physics letters, 71(24), 1997, pp. 3492-3494
Authors:
GRUVERMAN A
AUCIELLO O
TOKUMOTO H
Citation: A. Gruverman et al., SCANNING FORCE MICROSCOPY FOR THE STUDY OF DOMAIN-STRUCTURE IN FERROELECTRIC THIN-FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 602-605
Authors:
DAT R
AUCIELLO O
LICHTENWALNER DJ
KINGON AI
Citation: R. Dat et al., PULSED-LASER ABLATION-DEPOSITION OF LA0.5SR0.5COO3 FOR USE AS ELECTRODES IN NONVOLATILE FERROELECTRIC MEMORIES, Journal of materials research, 11(6), 1996, pp. 1514-1519