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Results:
1-23
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Results: 23
Authors:
AMADELLI R
VELICHENKO AB
TONDELLO E
ARMELAO L
DAOLIO S
FABRIZIO M
Citation: R. Amadelli et al., ION-BOMBARDMENT OF PBO2 FILMS - WATER INFLUENCE OF CLUSTER PRODUCTION, International journal of mass spectrometry and ion processes, 180, 1998, pp. 309-317
Authors:
RIZZI P
ANTONIONE C
BARICCO M
BATTEZZATI L
ARMELAO L
TONDELLO E
FABRIZIO M
DAOLIO S
Citation: P. Rizzi et al., CRYSTALS AND NANOCRYSTALS IN RAPIDLY SOLIDIFIED AL-SM ALLOYS, Nanostructured materials, 10(5), 1998, pp. 767-776
Authors:
DAOLIO S
DEBATTISTI A
FABRIZIO M
NANNI L
PICCIRILLO C
Citation: S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY CHARACTERIZATION OF IRO2-TA2O5 THIN-FILMS - EFFECT OF RELATIVE COMPOSITION ON ELECTRODE PROPERTIES, Rapid communications in mass spectrometry, 12(20), 1998, pp. 1574-1579
Authors:
FABRIZIO M
PICCIRILLO C
DAOLIO S
Citation: M. Fabrizio et al., ELECTROFORMED OBJECTS FOR JEWELRY - SECONDARY-ION MASS-SPECTROMETRY CHARACTERIZATION OF AU FILMS FROM CN-FREE ELECTROLYTES, Rapid communications in mass spectrometry, 12(13), 1998, pp. 857-863
Authors:
FABRIZIO M
PAGURA C
TOLSTOGOUZOV A
DAOLIO S
FERRETTI M
MAGNONE E
OLCESE GL
Citation: M. Fabrizio et al., SECONDARY-ION MASS-SPECTROMETRY CHARACTERIZATION OF NDBA2CU3O7-X AND EUBA2CU3O7-X SINGLE-CRYSTALS, Rapid communications in mass spectrometry, 12(11), 1998, pp. 675-682
Authors:
KRISTOF J
MIHALY J
DAOLIO S
DEBATTISTI A
NANNI L
PICCIRILLO C
Citation: J. Kristof et al., HYDROLYTIC REACTIONS IN HYDRATED IRIDIUM CHLORIDE COATINGS, Journal of electroanalytical chemistry [1992], 434(1-2), 1997, pp. 99-104
Authors:
PICCIRILLO C
FABRIZIO M
DAOLIO S
FACCHIN B
Citation: C. Piccirillo et al., ROLE OF SECONDARY-ION MASS-SPECTROMETRIC ANALYSIS IN THE BRAZING OF PRECIOUS ALLOYS, Rapid communications in mass spectrometry, 11(12), 1997, pp. 1309-1314
Authors:
PICCIRILLO C
DAOLIO S
KRISTOF J
MIHALY J
FACCHIN B
FABRIZIO M
Citation: C. Piccirillo et al., INFLUENCE OF SUPPORT MATERIAL ON FORMATION OF ELECTROCATALYTIC THIN-FILMS - A SECONDARY-ION MASS-SPECTROMETRY STUDY, International journal of mass spectrometry and ion processes, 161(1-3), 1997, pp. 141-149
INVESTIGATION OF THE FORMATION OF RUO2-BASED MIXED-OXIDE COATINGS BY SECONDARY-ION MASS-SPECTROMETRY
Authors:
DAOLIO S
KRISTOF J
PICCIRILLO C
PAGURA C
DEBATTISTI A
Citation: S. Daolio et al., INVESTIGATION OF THE FORMATION OF RUO2-BASED MIXED-OXIDE COATINGS BY SECONDARY-ION MASS-SPECTROMETRY, Journal of materials chemistry, 6(4), 1996, pp. 567-571
Authors:
DAOLIO S
KRISTOF J
MINK J
DEBATTISTI A
MIHALY J
PICCIRILLO C
Citation: S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRIC STUDIES ON THE FORMATION MECHANISM OF IRO2 ZRO2 BASED ELECTROCATALYTIC THIN-FILMS/, Rapid communications in mass spectrometry, 10(15), 1996, pp. 1881-1886
Authors:
DAOLIO S
KRISTOF J
PICCIRILLO C
GELOSI S
FACCHIN B
PAGURA C
Citation: S. Daolio et al., STUDY OF ZRO2 FILM EVOLUTION BY SECONDARY-ION MASS-SPECTROMETRY, Rapid communications in mass spectrometry, 10(14), 1996, pp. 1769-1773
Authors:
DAOLIO S
PICCIRILLO C
PAGURA C
FACCHIN B
ZECCHIN S
VERITA M
Citation: S. Daolio et al., GLASS SAMPLE CHARACTERIZATION BY SECONDARY-ION MASS-SPECTROMETRY, Rapid communications in mass spectrometry, 10(10), 1996, pp. 1286-1290
Authors:
DAOLIO S
KRISTOF J
PICCIRILLO C
FACCHIN B
PAGURA C
Citation: S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY STUDIES ON THE FORMATION OF THE VALVEMETAL-OXIDE IN RUTHENIUM-BASED AND IRIDIUM-BASED MIXED-OXIDE ELECTRODES, International journal of mass spectrometry and ion processes, 152(1), 1996, pp. 87-96
Authors:
KRISTOF J
DAOLIO S
PICCIRILLO C
FACCHIN B
MINK J
Citation: J. Kristof et al., INVESTIGATION ON THE FORMATION OF RUO2 FILM ELECTRODE BY SECONDARY-ION MASS-SPECTROMETRY, Surface science, 348(3), 1996, pp. 287-298
Authors:
BASTIANINI A
BATTISTON GA
GERBASI R
PORCHIA M
DAOLIO S
Citation: A. Bastianini et al., CHEMICAL-VAPOR-DEPOSITION OF ZRO2 THIN-FILMS USING ZR(NET(2))(4) AS PRECURSOR, Journal de physique. IV, 5(C5), 1995, pp. 525-531
Authors:
BASTIANINI A
BATTISTON GA
GERBASI R
PORCHIA M
DAOLIO S
Citation: A. Bastianini et al., CHEMICAL-VAPOR-DEPOSITION OF ZRO2 THIN-FILMS USING ZR(NET(2))(4) AS PRECURSOR, Journal de physique. IV, 5(C5), 1995, pp. 525-531
Authors:
KRISTOF J
DAOLIO S
PICCIRILLO C
FACCHIN B
PAGURA C
Citation: J. Kristof et al., SECONDARY-ION MASS-SPECTROMETRIC STUDIES ON THE FORMATION MECHANISM OF IRO2 TIO2-BASED COATINGS/, Rapid communications in mass spectrometry, 9(15), 1995, pp. 1475-1479
Authors:
MINK J
KRISTOF J
DEBATTISTI A
DAOLIO S
NEMETH C
Citation: J. Mink et al., INVESTIGATION ON THE FORMATION OF RUO2-BASED MIXED-OXIDE COATINGS BY SPECTROSCOPIC METHODS, Surface science, 335(1-3), 1995, pp. 252-257
Authors:
DAOLIO S
FACCHIN B
PAGURA C
DEBATTISTI A
GELOSI S
Citation: S. Daolio et al., SIMS METHODS IN REACTIVITY STUDIES ON METAL-OXIDES, Inorganica Chimica Acta, 235(1-2), 1995, pp. 381-390
Authors:
DAOLIO S
FACCHIN B
PAGURA C
DEBATTISTI A
BARBIERI A
KRISTOF J
Citation: S. Daolio et al., CHARACTERIZATION OF RUO2-BASED FILM ELECTRODES BY SECONDARY-ION MASS-SPECTROMETRY, Journal of materials chemistry, 4(8), 1994, pp. 1255-1258
Authors:
DAOLIO S
FACCHIN B
PAGURA C
DEBATTISTI A
BARBIERI A
Citation: S. Daolio et al., SECONDARY-ION MASS-SPECTROMETRY METHODOLOGY AND SURFACE-CHEMISTRY OF MIXED-OXIDE ELECTRODES - MODIFICATIONS INDUCED BY NOBLE-METAL CONTENT, Rapid communications in mass spectrometry, 8(8), 1994, pp. 659-665
Authors:
DAOLIO S
FACCHIN B
PAGURA C
DEBATTISTI A
BARBIERI A
Citation: S. Daolio et al., SURFACE CHEMICAL-CHANGES OF MIXED-OXIDE FILMS IN CL2 ANODIC PRODUCTION, Rapid communications in mass spectrometry, 7(10), 1993, pp. 887-890
Authors:
CASALBOREMICELI G
BEGGIATO G
GERI A
ZOTTI G
DAOLIO S
Citation: G. Casalboremiceli et al., INFLUENCE OF THE REACTION MEDIUM ON THE POLYMERIZATION MECHANISM OF THIONAPHTHENEINDOLE, Synthetic metals, 60(2), 1993, pp. 105-110
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1-23
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