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Results:
1-20
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Results: 20
Authors:
Langley, RA
Browning, JF
Balsley, SD
Banks, JC
Doyle, BL
Wampler, WR
Beavis, LG
Citation: Ra. Langley et al., Technique for production of calibrated metal hydride films, J VAC SCI A, 19(5), 2001, pp. 2706-2708
Authors:
Vizkelethy, G
Brunett, BA
Walsh, DS
James, RB
Doyle, BL
Citation: G. Vizkelethy et al., Investigation of the electronic properties of cadmium zinc telluride (CZT)detectors using a nuclear microprobe, NUCL INST A, 458(1-2), 2001, pp. 563-567
Authors:
Doyle, BL
Walsh, DS
Renfrow, SN
Vizkelethy, G
Schenkel, T
Hamza, AV
Citation: Bl. Doyle et al., Nuclear emission microscopies, NUCL INST B, 181, 2001, pp. 199-210
Authors:
Guo, BN
El Bouanani, M
Renfrow, SN
Nigam, M
Walsh, DS
Doyle, BL
Duggan, JL
McDaniel, FD
Citation: Bn. Guo et al., Diffusion-time-resolved ion-beam-induced charge collection from stripe-like test junctions induced by heavy-ion microbeams, NUCL INST B, 181, 2001, pp. 315-319
Authors:
Yang, C
Doyle, BL
Rossi, P
Nigam, M
El Bouanani, M
Duggan, JL
McDaniel, FD
Citation: C. Yang et al., Luminescent layers for ion-photon emission microscopy, NUCL INST B, 181, 2001, pp. 329-334
Authors:
Schenkel, T
Newman, MW
Niedermayr, TR
Machicoane, GA
McDonald, JW
Barnes, AV
Hamza, AV
Banks, JC
Doyle, BL
Wu, KJ
Citation: T. Schenkel et al., Electronic sputtering of solids by slow, highly charged ions: Fundamentalsand applications, NUCL INST B, 161, 2000, pp. 65-75
Authors:
Browning, JF
Langley, RA
Doyle, BL
Banks, JC
Wampler, WR
Citation: Jf. Browning et al., High accuracy, high energy He-ERD analysis of H, D and T, NUCL INST B, 161, 2000, pp. 211-215
Authors:
Font, AC
Banks, JC
Doyle, BL
Citation: Ac. Font et al., Quantitative analysis with heavy ion E-TOF-ERD, NUCL INST B, 161, 2000, pp. 255-259
Authors:
Bianconi, M
Abel, F
Banks, JC
Font, AC
Cohen, C
Doyle, BL
Lotti, R
Lulli, G
Nipoti, R
Vickridge, I
Walsh, D
Wendler, E
Citation: M. Bianconi et al., The Si surface yield as a calibration standard for RBS, NUCL INST B, 161, 2000, pp. 293-296
Authors:
Doyle, BL
Vizkelethy, G
Walsh, DS
Citation: Bl. Doyle et al., Ion beam induced charge collection (IBICC) studies of cadmium zinc telluride (CZT) radiation detectors, NUCL INST B, 161, 2000, pp. 457-461
Authors:
Walsh, DS
Doyle, BL
Citation: Ds. Walsh et Bl. Doyle, Simultaneous nuclear reaction analyses of boron and phosphorus in thin borophosphosilicate glass films using (alpha, p) reactions, NUCL INST B, 161, 2000, pp. 629-634
Authors:
Gago, R
Jimenez, I
Albella, JM
Climent-Font, A
Caceres, D
Vergara, I
Banks, JC
Doyle, BL
Terminello, LJ
Citation: R. Gago et al., Bonding and hardness in nonhydrogenated carbon films with moderate sp(3) content, J APPL PHYS, 87(11), 2000, pp. 8174-8180
Authors:
Venturini, EL
Provencio, PN
Doyle, BL
Brice, DK
Citation: El. Venturini et al., Strong vortex pinning by elongated, discontinuous defects in Tl-Ba-Ca-Cu-Ofilms, IEEE APPL S, 9(2), 1999, pp. 2292-2295
Authors:
Franks, LA
Brunett, BA
Olsen, RW
Walsh, DS
Vizkelethy, G
Trombka, JI
Doyle, BL
James, RB
Citation: La. Franks et al., Radiation damage measurements in room-temperature semiconductor radiation detectors, NUCL INST A, 428(1), 1999, pp. 95-101
Authors:
Doyle, BL
Vizkelethy, G
Walsh, DS
Senftinger, B
Mellon, M
Citation: Bl. Doyle et al., A new approach to nuclear microscopy: the ion-electron emission microscope, NUCL INST B, 158(1-4), 1999, pp. 6-17
Authors:
McDaniel, FD
Guo, BN
Renfrow, SN
El Bouanani, M
Duggan, JL
Doyle, BL
Walsh, DS
Aton, TJ
Citation: Fd. Mcdaniel et al., Ion beam Induced charge collection (IBICC) of integrated circuits using a 10 MeV carbon microbeam, NUCL INST B, 158(1-4), 1999, pp. 264-269
Authors:
Schone, N
Walsh, DS
Sexton, FW
Doyle, BL
Dodd, PE
Aurand, JF
Wing, N
Citation: N. Schone et al., Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics, NUCL INST B, 158(1-4), 1999, pp. 424-431
Authors:
Vizkelethy, G
Brunett, BA
Walsh, DS
James, RB
Olsen, RW
Doyle, BL
Citation: G. Vizkelethy et al., Ion microbeam studies of cadmium zinc telluride radiation detectors by IBICC, NUCL INST B, 158(1-4), 1999, pp. 437-444
Authors:
Schone, H
Walsh, DS
Sexton, FW
Doyle, BL
Dodd, PE
Aurand, JF
Flores, RS
Wing, N
Citation: H. Schone et al., Time-resolved ion beam induced charge collection (TRIBICC) in micro-electronics, IEEE NUCL S, 45(6), 1998, pp. 2544-2549
Authors:
Schanwald, LP
Schwank, JR
Sniegowski, JJ
Walsh, DS
Smith, NF
Peterson, KA
Shaneyfelt, MR
Winokur, PS
Smith, JH
Doyle, BL
Citation: Lp. Schanwald et al., Radiation effects on surface micromachined comb drives and microengines, IEEE NUCL S, 45(6), 1998, pp. 2789-2798
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1-20
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