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Results: 1-25/27
Authors:
ZWORNER O
HOLSCHER H
SCHWARZ UD
WIESENDANGER R
Citation: O. Zworner et al., THE VELOCITY DEPENDENCE OF FRICTIONAL FORCES IN POINT-CONTACT FRICTION, Applied physics A: Materials science & processing, 66, 1998, pp. 263-267
Authors:
HOLSCHER H
SCHWARZ UD
ZWORNER O
WIESENDANGER R
Citation: H. Holscher et al., CONSEQUENCES OF THE STICK-SLIP MOVEMENT FOR THE SCANNING FORCE MICROSCOPY IMAGING OF GRAPHITE, Physical review. B, Condensed matter, 57(4), 1998, pp. 2477-2481
Authors:
BLUHM H
SCHWARZ UD
WIESENDANGER R
Citation: H. Bluhm et al., ORIGIN OF THE FERROELECTRIC DOMAIN CONTRAST OBSERVED IN LATERAL FORCEMICROSCOPY, Physical review. B, Condensed matter, 57(1), 1998, pp. 161-169
Authors:
ALLERS W
SCHWARZ A
SCHWARZ UD
WIESENDANGER R
Citation: W. Allers et al., SCANNING FORCE MICROSCOPE WITH ATOMIC-RESOLUTION IN ULTRAHIGH-VACUUM AND AT LOW-TEMPERATURES, Review of scientific instruments, 69(1), 1998, pp. 221-225
Authors:
SCHWARZ UD
ZWORNER O
KOSTER P
WIESENDANGER R
Citation: Ud. Schwarz et al., PREPARATION OF PROBE TIPS WITH WELL-DEFINED SPHERICAL APEXES FOR QUANTITATIVE SCANNING FORCE SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 1527-1530
Authors:
HOLSCHER H
SCHWARZ UD
ZWORNER O
WIESENDANGER R
Citation: H. Holscher et al., STICK-SLIP MOVEMENT OF A SCANNED TIP ON A GRAPHITE SURFACE IN SCANNING FORCE MICROSCOPY, Zeitschrift fur Physik. B, Condensed matter, 104(2), 1997, pp. 295-297
Authors:
SCHWARZ UD
ZWORNER O
KOSTER P
WIESENDANGER R
Citation: Ud. Schwarz et al., QUANTITATIVE-ANALYSIS OF THE FRICTIONAL-PROPERTIES OF SOLID MATERIALSAT LOW LOADS .1. CARBON-COMPOUNDS, Physical review. B, Condensed matter, 56(11), 1997, pp. 6987-6996
Authors:
SCHWARZ UD
ZWORNER O
KOSTER P
WIESENDANGER P
Citation: Ud. Schwarz et al., QUANTITATIVE-ANALYSIS OF THE FRICTIONAL-PROPERTIES OF SOLID MATERIALSAT LOW LOADS .2. MICA AND GERMANIUM SULFIDE, Physical review. B, Condensed matter, 56(11), 1997, pp. 6997-7000
Authors:
HOLSCHER H
SCHWARZ UD
WIESENDANGER R
Citation: H. Holscher et al., MODELING OF THE SCAN PROCESS IN LATERAL FORCE MICROSCOPY, Surface science, 375(2-3), 1997, pp. 395-402
Authors:
ALLERS W
HAHN C
LOHNDORF M
LUKAS S
PAN S
SCHWARZ UD
WIESENDANGER R
Citation: W. Allers et al., NANOMECHANICAL INVESTIGATIONS AND MODIFICATIONS OF THIN-FILMS BASED ON SCANNING FORCE METHODS, Nanotechnology, 7(4), 1996, pp. 346-350
Authors:
WIESENDANGER R
BODE M
PASCAL R
ALLERS W
SCHWARZ UD
Citation: R. Wiesendanger et al., ISSUES OF ATOMIC-RESOLUTION STRUCTURE AND CHEMICAL-ANALYSIS BY SCANNING PROBE MICROSCOPY AND SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(3), 1996, pp. 1161-1167
Authors:
HOLSCHER H
SCHWARZ UD
WIESENDANGER R
Citation: H. Holscher et al., SIMULATION OF A SCANNED TIP ON A NAF(001) SURFACE IN FRICTION FORCE MICROSCOPY, Europhysics letters, 36(1), 1996, pp. 19-24
Authors:
SEIDER M
SCHWARZ UD
WIESENDANGER R
Citation: M. Seider et al., LOAD-DEPENDENT TOPOGRAPHIC AND FRICTION STUDIES OF INDIVIDUAL ION TRACKS IN LAYERED MATERIALS BY SCANNING FORCE MICROSCOPY AND LATERAL FORCE MICROSCOPY, Physical review. B, Condensed matter, 53(24), 1996, pp. 16180-16183
Authors:
SCHWARZ UD
KOSTER P
WIESENDANGER R
Citation: Ud. Schwarz et al., QUANTITATIVE-ANALYSIS OF LATERAL FORCE MICROSCOPY EXPERIMENTS, Review of scientific instruments, 67(7), 1996, pp. 2560-2567
Authors:
BLUHM H
SCHWARZ UD
MEYER KP
Citation: H. Bluhm et al., ANISOTROPY SLIDING FRICTION ON THE TRIGLYCINE SULFATE (010)SURFACE, Applied physics A: Materials science & processing, 61(5), 1995, pp. 525-533
Authors:
SCHWARZ UD
ALLERS W
GENSTERBLUM G
PIREAUX JJ
WIESENDANGER R
Citation: Ud. Schwarz et al., GROWTH OF C-60 THIN-FILMS ON GES(001) STUDIED BY SCANNING FORCE MICROSCOPY, Physical review. B, Condensed matter, 52(8), 1995, pp. 5967-5976
Authors:
SCHWARZ UD
ALLERS W
GENSTERBLUM G
WIESENDANGER R
Citation: Ud. Schwarz et al., LOW-LOAD FRICTION BEHAVIOR OF EPITAXIAL C-60 MONOLAYERS UNDER HERTZIAN CONTACT, Physical review. B, Condensed matter, 52(20), 1995, pp. 14976-14984
Authors:
SCHWARZ A
SCHWARZ UD
BLUHM H
WIESENDANGER R
Citation: A. Schwarz et al., DETERMINATION OF MILLER INDEXES OF SIDE FACES OF SMALL CRYSTALLITES FROM SCANNING FORCE MICROSCOPY ANGLE MEASUREMENTS, Surface and interface analysis, 23(6), 1995, pp. 409-415
Authors:
ALLERS W
SCHWARZ UD
GENSTERBLUM G
WIESENDANGER R
Citation: W. Allers et al., SCANNING AND FRICTION-FORCE MICROSCOPY OF THIN C-60 FILMS ON GES(001), Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 11-15
Authors:
BLUHM H
SCHWARZ UD
HERRMANN F
PAUFLER P
Citation: H. Bluhm et al., STUDY OF THE INFLUENCE OF NATIVE-OXIDE LAYERS ON ATOMIC-FORCE MICROSCOPY IMAGING OF SEMICONDUCTOR SURFACES, Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 23-27
Authors:
SCHWARZ UD
HAEFKE H
Citation: Ud. Schwarz et H. Haefke, INVESTIGATION OF PRECIPITATED COLLOIDAL PARTICLES BY SCANNING FORCE MICROSCOPY - SILVER-HALIDE MICROCRYSTALS, Applied physics. A, Solids and surfaces, 59(1), 1994, pp. 33-40
Authors:
SCHWARZ UD
HAEFKE H
REIMANN P
GUNTHERODT HJ
Citation: Ud. Schwarz et al., TIP ARTIFACTS IN SCANNING FORCE MICROSCOPY, Journal of Microscopy, 173, 1994, pp. 183-197
Authors:
HAEFKE H
SCHWARZ UD
GUNTHERODT HJ
FROB H
GERTH G
STEIGER R
Citation: H. Haefke et al., INVESTIGATION OF AGBR PHOTOGRAPHIC SYSTEMS WITH SCANNING FORCE MICROSCOPY, Journal of imaging science and technology, 37(6), 1993, pp. 545-551
Authors:
SCHWARZ UD
HAEFKE H
GUNTHERODT HJ
BOHONEK J
STEIGER R
Citation: Ud. Schwarz et al., ATOMIC-FORCE MICROSCOPY STUDY OF CUBIC AND OCTAHEDRAL AGBR MICROCRYSTALS, Journal of imaging science and technology, 37(4), 1993, pp. 344-347
Authors:
MOSER A
HUG HJ
JUNG T
SCHWARZ UD
GUNTHERODT HJ
Citation: A. Moser et al., A MINIATURE FIBER OPTIC FORCE MICROSCOPE SCAN HEAD, Measurement science & technology, 4(7), 1993, pp. 769-775