AAAAAA

   
Results: 1-16 |
Results: 16
Phase boundary fluctuations on Si(l11)
Authors: Hannon, JB Tromp, RM
Citation: Jb. Hannon et Rm. Tromp, Phase boundary fluctuations on Si(l11), J VAC SCI A, 19(5), 2001, pp. 2596-2600
Phase coexistence during surface phase transitions
Authors: Hannon, JB Heringdorf, FJMZ Tersoff, J Tromp, RM
Citation: Jb. Hannon et al., Phase coexistence during surface phase transitions, PHYS REV L, 86(21), 2001, pp. 4871-4874
Growth dynamics of pentacene thin films
Authors: Heringdorf, FJMZ Reuter, MC Tromp, RM
Citation: Fjmz. Heringdorf et al., Growth dynamics of pentacene thin films, NATURE, 412(6846), 2001, pp. 517-520
Texture transformations in reactive metal films deposited upon amorphous substrates
Authors: Dunn, DN Hull, R Ross, FM Tromp, RM
Citation: Dn. Dunn et al., Texture transformations in reactive metal films deposited upon amorphous substrates, J APPL PHYS, 89(5), 2001, pp. 2635-2640
In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si(001) heterostructures
Authors: Stach, A Hull, R Tromp, RM Ross, FM Reuter, MC Bean, JC
Citation: A. Stach et al., In-situ transmission electron microscopy studies of the interaction between dislocations in strained SiGe/Si(001) heterostructures, PHIL MAG A, 80(9), 2000, pp. 2159-2200
Advances in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si
Authors: Tromp, RM Ross, FM
Citation: Rm. Tromp et Fm. Ross, Advances in situ ultra-high vacuum electron microscopy: Growth of SiGe on Si, ANN R MATER, 30, 2000, pp. 431-449
Thermal roughening of a thin film: A new type of roughening transition
Authors: Maxson, JB Savage, DE Liu, F Tromp, RM Reuter, MC Lagally, MG
Citation: Jb. Maxson et al., Thermal roughening of a thin film: A new type of roughening transition, PHYS REV L, 85(10), 2000, pp. 2152-2155
New mechanism for dislocation blocking in strained layer epitaxial growth
Authors: Stach, EA Schwarz, KW Hull, R Ross, FM Tromp, RM
Citation: Ea. Stach et al., New mechanism for dislocation blocking in strained layer epitaxial growth, PHYS REV L, 84(5), 2000, pp. 947-950
Instability-driven SiGe island growth
Authors: Tromp, RM Ross, FM Reuter, MC
Citation: Rm. Tromp et al., Instability-driven SiGe island growth, PHYS REV L, 84(20), 2000, pp. 4641-4644
Low-energy electron microscopy
Authors: Tromp, RM
Citation: Rm. Tromp, Low-energy electron microscopy, IBM J RES, 44(4), 2000, pp. 503-516
Growth kinetics of CoSi2 and Ge islands observed with in situ transmissionelectron microscopy
Authors: Ross, FM Bennett, PA Tromp, RM Tersoff, J Reuter, M
Citation: Fm. Ross et al., Growth kinetics of CoSi2 and Ge islands observed with in situ transmissionelectron microscopy, MICRON, 30(1), 1999, pp. 21-32
Hot Electron Emission Lithography: a method for efficient large area e-beam projection
Authors: Poppeller, M Cartier, E Tromp, RM
Citation: M. Poppeller et al., Hot Electron Emission Lithography: a method for efficient large area e-beam projection, MICROEL ENG, 46(1-4), 1999, pp. 183-186
Transition states between pyramids and domes during Ge/Si island growth
Authors: Ross, FM Tromp, RM Reuter, MC
Citation: Fm. Ross et al., Transition states between pyramids and domes during Ge/Si island growth, SCIENCE, 286(5446), 1999, pp. 1931-1934
Island growth of Ge on Si(001) and CoSi2 on Si(111) studied with UHV electron microscopy
Authors: Ross, FM Tersoff, J Tromp, RM Reuter, MC Bennett, PA
Citation: Fm. Ross et al., Island growth of Ge on Si(001) and CoSi2 on Si(111) studied with UHV electron microscopy, J ELEC MICR, 48, 1999, pp. 1059-1066
Atomic step dynamics on periodic semiconductor surface structures
Authors: Blakely, JM Tanaka, S Tromp, RM
Citation: Jm. Blakely et al., Atomic step dynamics on periodic semiconductor surface structures, J ELEC MICR, 48(6), 1999, pp. 747-752
A new low energy electron microscope
Authors: Tromp, RM Mankos, M Reuter, MC Ellis, AW Copel, M
Citation: Rm. Tromp et al., A new low energy electron microscope, SURF REV L, 5(6), 1998, pp. 1189-1197
Risultati: 1-16 |