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Results:
1-23
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Results: 23
Authors:
RAFAJA D
VALVODA V
SIKOLA T
SPOUSTA J
Citation: D. Rafaja et al., AB-INITIO STUDY OF THIN METALLIC AND CERAMIC FILMS, Thin solid films, 324(1-2), 1998, pp. 198-208
Authors:
CHLADEK M
DORNER C
MATNER M
HOFFMANN H
VALVODA V
Citation: M. Chladek et al., STRUCTURAL AND MAGNETIC ANALYSIS OF NI81FE19 AG MULTILAYERS WITH ULTRATHIN NI81FE19 SUBLAYERS/, Journal of physics. Condensed matter, 9(22), 1997, pp. 4557-4574
Authors:
CHLADEK M
VALVODA V
DORNER C
ERNST W
Citation: M. Chladek et al., QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .1. INTERLAYER STRUCTURE, Journal of magnetism and magnetic materials, 172(3), 1997, pp. 209-217
Authors:
CHLADEK M
VALVODA V
DORNER C
Citation: M. Chladek et al., QUANTITATIVE COMPARISON OF STRUCTURAL PARAMETERS OF MAGNETIC MULTILAYERS OBTAINED BY DIFFRACTION METHODS AND BY DIRECT IMAGING TECHNIQUES .2. INTRALAYER STRUCTURE, Journal of magnetism and magnetic materials, 172(3), 1997, pp. 218-224
Authors:
RAFAJA D
VALVODA V
PERRY AJ
TREGLIO JR
Citation: D. Rafaja et al., DEPTH PROFILE OF RESIDUAL-STRESS IN METAL-ION IMPLANTED TIN COATINGS, Surface & coatings technology, 92(1-2), 1997, pp. 135-141
Authors:
RAFAJA D
CHLADEK M
VALVODA V
SEDDAT M
LASSRI H
KRISHNAN R
Citation: D. Rafaja et al., MICROSTRUCTURE OF CO-NI AU MULTILAYERS STUDIED BY XRD/, Thin solid films, 292(1-2), 1997, pp. 61-68
Authors:
RAFAJA D
VALVODA V
KUZEL R
PERRY AJ
TREGLIO JR
Citation: D. Rafaja et al., XRD CHARACTERIZATION OF ION-IMPLANTED TIN COATINGS, Surface & coatings technology, 87-8(1-3), 1996, pp. 302-308
Authors:
VALVODA V
Citation: V. Valvoda, STRUCTURE OF TIN COATINGS, Surface & coatings technology, 80(1-2), 1996, pp. 61-65
Authors:
CHLADEK M
DORNER C
BUCHAL A
VALVODA V
HOFFMANN H
Citation: M. Chladek et al., QUANTITATIVE IN-SITU X-RAY-DIFFRACTION ANALYSIS OF MAGNETIC MULTILAYERS DURING ANNEALING, Journal of applied physics, 80(3), 1996, pp. 1437-1445
Authors:
VALVODA V
CHLADEK M
CERNY R
Citation: V. Valvoda et al., JOINT TEXTURE REFINEMENT, Journal of applied crystallography, 29, 1996, pp. 48-52
Authors:
CHLADEK M
VALVODA V
DORNER C
HOLY C
GRIM J
Citation: M. Chladek et al., QUANTITATIVE STUDY OF INTERFACE ROUGHNESS REPLICATION IN MULTILAYERS USING X-RAY REFLECTIVITY AND TRANSMISSION ELECTRON-MICROSCOPY, Applied physics letters, 69(9), 1996, pp. 1318-1320
Authors:
VALVODA V
Citation: V. Valvoda, STRUCTURE OF THIN-FILMS OF TITANIUM NITRIDE, Journal of alloys and compounds, 219, 1995, pp. 83-87
Authors:
PERRY AJ
TREGLIO JR
VALVODA V
RAFAJA D
Citation: Aj. Perry et al., RESIDUAL-STRESS IN METAL-ION IMPLANTED TITANIUM NITRIDE FILMS STUDIEDBY GLANCING INCIDENCE X-RAY-DIFFRACTION, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1067-1072
Authors:
KRISHNAN R
LASSRI H
NYVLT M
PROSSER V
RAFAJA D
VALVODA V
VISNOVSKY S
Citation: R. Krishnan et al., MAGNETIC AND MAGNETOOPTICAL POLAR KERR SPECTRA STUDIES IN NI AU MULTILAYERS/, Journal of magnetism and magnetic materials, 148(1-2), 1995, pp. 285-286
EFFECT OF ION-BOMBARDMENT ON THE SURFACE-MORPHOLOGY OF ZN-FILMS SPUTTERED IN AN UNBALANCED MAGNETRON
Authors:
MUSIL J
MATOUS J
VALVODA V
Citation: J. Musil et al., EFFECT OF ION-BOMBARDMENT ON THE SURFACE-MORPHOLOGY OF ZN-FILMS SPUTTERED IN AN UNBALANCED MAGNETRON, Vacuum, 46(2), 1995, pp. 203-210
Authors:
KUZEL R
CERNY R
VALVODA V
BLOMBERG M
MERISALO M
KADLEC S
Citation: R. Kuzel et al., COMPLEX XRD MICROSTRUCTURAL STUDIES OF HARD COATINGS APPLIED TO PVD-DEPOSITED TIN FILMS .2. TRANSITION FROM POROUS TO COMPACT FILMS AND MICROSTRUCTURAL INHOMOGENEITY OF THE LAYERS, Thin solid films, 268(1-2), 1995, pp. 72-82
Authors:
KUZEL R
VALVODA V
CHLADEK M
MUSIL J
MATOUS J
Citation: R. Kuzel et al., XRD MICROSTRUCTURAL STUDY OF ZN FILMS DEPOSITED BY UNBALANCED MAGNETRON SPUTTERING, Thin solid films, 263(2), 1995, pp. 150-158
Authors:
CERNY R
VALVODA V
CHLADEK M
Citation: R. Cerny et al., EMPIRICAL TEXTURE CORRECTIONS FOR ASYMMETRIC DIFFRACTION AND INCLINEDTEXTURES, Journal of applied crystallography, 28, 1995, pp. 247-253
Authors:
PERRY AJ
TREGLIO JR
SCHAFFER JP
BRUNNER J
VALVODA V
RAFAJA D
Citation: Aj. Perry et al., NONDESTRUCTIVE STUDY OF THE ION-IMPLANTATION-AFFECTED ZONE (THE LONG-RANGE EFFECT) IN TITANIUM NITRIDE, Surface & coatings technology, 66(1-3), 1994, pp. 377-383
Authors:
CERNY R
KUZEL R
VALVODA V
KADLEC S
MUSIL J
Citation: R. Cerny et al., MICROSTRUCTURE OF TITANIUM NITRIDE THIN-FILMS CONTROLLED BY ION-BOMBARDMENT IN A MAGNETRON-SPUTTERING DEVICE, Surface & coatings technology, 64(2), 1994, pp. 111-117
Authors:
PERRY AJ
VALVODA V
RAFAJA D
Citation: Aj. Perry et al., ON THE RESIDUAL-STRESS AND PICO-STRUCTURE OF TITANIUM NITRIDE FILMS .2. A PICO-STRUCTURAL MODEL, Vacuum, 45(1), 1994, pp. 11-14
Authors:
KUZEL R
CERNY R
VALVODA V
BLOMBERG M
MERISALO M
Citation: R. Kuzel et al., COMPLEX XRD MICROSTRUCTURAL STUDIES OF HARD COATINGS APPLIED TO PVD-DEPOSITED TIN FILMS .1. PROBLEMS AND METHODS, Thin solid films, 247(1), 1994, pp. 64-78
Authors:
MUSIL J
POULEK V
VALVODA V
KUZEL R
JEHN HA
BAUMGARTNER ME
Citation: J. Musil et al., RELATION OF DEPOSITION CONDITIONS OF TI-N FILMS PREPARED BY DC MAGNETRON SPUTTERING TO THEIR MICROSTRUCTURE AND MACROSTRESS, Surface & coatings technology, 60(1-3), 1993, pp. 484-488
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