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Results:
1-20
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Results: 20
Authors:
KEHOE L
KELLY PV
CREAN GM
Citation: L. Kehoe et al., APPLICATION OF THE LASER FLASH DIFFUSIVITY METHOD TO THIN HIGH THERMAL-CONDUCTIVITY MATERIALS, Microsystem technologies, 5(1), 1998, pp. 18-21
Authors:
LAFFERTY EJ
MACAULEY DJ
MONGEY KF
KELLY PV
CREAN GM
Citation: Ej. Lafferty et al., PHOTO-ASSISTED METALLIZATION - LINE RESOLUTION STUDIES, Surface & coatings technology, 101(1-3), 1998, pp. 80-84
Authors:
MACAULEY DJ
MONGEY KF
KELLY PV
CREAN GM
Citation: Dj. Macauley et al., COMPARISON OF PROCESSES FOR SELECTIVE ELECTROLESS COPPER PLATING ON 96-PERCENT ALUMINA PHOTO-SELECTIVELY ACTIVATED USING CHLORINATED AND NONCHLORINATED PHOTOCHEMICAL COATINGS - PHOTOACTIVITY AND RELIABILITY STUDIES, Surface & coatings technology, 101(1-3), 1998, pp. 238-242
Authors:
AURET FD
MEYER WE
DEENAPANRAY PNK
GOODMAN SA
MYBURG G
MURTAGH M
YE SR
CREAN GM
Citation: Fd. Auret et al., ELECTRICAL CHARACTERIZATION OF HE-PLASMA PROCESSED N-GAAS, Journal of applied physics, 84(4), 1998, pp. 1973-1976
Authors:
MURTAGH M
LYNCH SM
KELLY PV
HILDEBRANT S
HERBERT PAF
JEYNES C
CREAN GM
Citation: M. Murtagh et al., PHOTOREFLECTANCE CHARACTERIZATION OF AR+ ION ETCHED AND SICL4 REACTIVE ION ETCHED SILICON(100), Materials science and technology, 13(11), 1997, pp. 961-964
Authors:
PATTERSON JC
OREILLY M
CREAN GM
BARRETT J
Citation: Jc. Patterson et al., SELECTIVE ELECTROLESS COPPER METALLIZATION ON A TITANIUM NITRIDE BARRIER LAYER, Microelectronic engineering, 33(1-4), 1997, pp. 65-73
Authors:
BEECHINOR JT
MCGLYNN E
OREILLY M
CREAN GM
Citation: Jt. Beechinor et al., OPTICAL CHARACTERIZATION OF THIN-FILM BENZOCYCLOBUTENE (BCB) BASED POLYMERS, Microelectronic engineering, 33(1-4), 1997, pp. 363-368
Authors:
PAUL DJ
RYAN JH
KELLY PV
CREAN GM
FERNANDEZ JM
PEPPER M
BROERS AN
JOYCE BA
Citation: Dj. Paul et al., INVESTIGATIONS OF ELECTRON-BEAM AND OPTICAL INDUCED DAMAGE IN HIGH-MOBILITY SIGE HETEROSTRUCTURES, Solid-state electronics, 41(10), 1997, pp. 1509-1513
Authors:
AURET FD
MYBURG G
MEYER WE
DEENAPANRAY PNK
NORDHOFF H
GOODMAN SA
MURTAGH M
YE SR
CREAN GM
Citation: Fd. Auret et al., ELECTRICAL CHARACTERIZATION OF DEFECTS IN SICL4 PLASMA-ETCHED N-GAAS AND PD SCHOTTKY DIODES FABRICATED ON IT, Applied physics letters, 71(5), 1997, pp. 668-670
Authors:
FLANNERY CM
KELLY PV
BEECHINOR JT
CREAN GM
Citation: Cm. Flannery et al., OBSERVATION OF WAVELENGTH-DEPENDENT GENERATION EFFICIENCY OF LASER-INDUCED ULTRASONIC SURFACE ACOUSTIC-WAVES ON CERAMIC MATERIALS, Applied physics letters, 71(26), 1997, pp. 3767-3769
Authors:
KEHOE L
KELLY PV
OCONNOR GM
OREILLY M
CREAN GM
Citation: L. Kehoe et al., A METHODOLOGY FOR LASER-BASED THERMAL-DIFFUSIVITY MEASUREMENT OF ADVANCED MULTICHIP-MODULE CERAMIC MATERIALS, IEEE transactions on components, packaging, and manufacturing technology. Part A, 18(4), 1995, pp. 773-780
Authors:
CREAN GM
MASSUE JP
Citation: Gm. Crean et Jp. Massue, SPECIAL ISSUE - FIRST EUROPEAN-MATERIAL-RESEARCH-SOCIETY (E-MRS) WORKSHOP ON ADVANCED MATERIALS EDUCATION - COUNCIL OF EUROPE, STRASBOURG, 24-26TH MAY, 1994, Materials science & engineering. A, Structural materials: properties, microstructure and processing, 199(1), 1995, pp. 7-8
Authors:
LYNCH S
GREEF R
STOEMENOS J
DARTNELL NJ
LLOYD NS
KERN P
STUCK R
CREAN GM
Citation: S. Lynch et al., CHARACTERIZATION OF SEMIINSULATING POLYSILICON OXYGEN DOPED SILICON THIN-FILMS, Materials science and technology, 11(1), 1995, pp. 80-84
Authors:
PATTERSON JC
NIDHEASUNA C
BARRETT J
SPALDING TR
OREILLY M
JIANG X
CREAN GM
Citation: Jc. Patterson et al., ELECTROLESS COPPER METALLIZATION OF TITANIUM NITRIDE, Applied surface science, 91(1-4), 1995, pp. 124-128
Authors:
OREILLY M
JIANG X
BEECHINOR JT
LYNCH S
NIDHEASUNA CN
PATTERSON JC
CREAN GM
Citation: M. Oreilly et al., INVESTIGATION OF THE OXIDATION BEHAVIOR OF THIN-FILM AND BULK COPPER, Applied surface science, 91(1-4), 1995, pp. 152-156
Authors:
AMOKRANE R
LYNCH S
MURTAGH M
CREAN GM
Citation: R. Amokrane et al., ELECTRONIC TRANSPORT-PROPERTIES OF LPCVD SEMIINSULATING POLYCRYSTALLINE SILICON (SIPOS), Microelectronic engineering, 28(1-4), 1995, pp. 455-458
Authors:
HERBERT PAF
MURTAGH M
KELLY PV
CREAN GM
KELLY WM
Citation: Paf. Herbert et al., ONLINE DETECTION AND MONITORING OF PLASMA ETCH DAMAGE TO SEMIINSULATING GAAS, Microelectronic engineering, 21(1-4), 1993, pp. 315-320
Authors:
LYNCH S
MURTAGH M
CREAN GM
KELLY PV
OCONNOR M
JEYNES C
Citation: S. Lynch et al., NONDESTRUCTIVE DEPTH PROFILING OF SILICON ION-IMPLANTATION INDUCED DAMAGE IN SILICON (100) SUBSTRATES, Thin solid films, 233(1-2), 1993, pp. 199-202
Authors:
GREEF R
GRAY DE
DARTNELL NJ
ZHU J
LYNCH S
CREAN GM
Citation: R. Greef et al., CHARACTERIZATION OF SILICON-ON-INSULATOR MULTILAYERS USING EX-SITU SPECTROSCOPIC ELLIPSOMETRY AND IN-SITU MONOCHROMATIC ELLIPSOMETRY DURINGPLASMA-ETCHING, Thin solid films, 233(1-2), 1993, pp. 214-217
Authors:
ZHANG D
CREAN GM
FLAHERTY T
SHALLOW A
Citation: D. Zhang et al., DEVELOPMENT OF INTERDIGITATED ACOUSTIC-WAVE TRANSDUCERS FOR BIOSENSORAPPLICATIONS, Analyst, 118(4), 1993, pp. 429-432
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