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Results:
1-19
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Results: 19
Authors:
DEWOLF I
MAES HE
Citation: I. Dewolf et He. Maes, MECHANICAL-STRESS MEASUREMENTS USING MICRO-RAMAN SPECTROSCOPY, Microsystem technologies, 5(1), 1998, pp. 13-17
Authors:
BIJNENS W
DEWOLF I
MANCA J
DHAEN J
WU TD
DOLIESLAEGER M
BEYNE E
KIEBOOMS R
VANDERZANDE D
GELAN J
DECEUNINCK W
DESCHEPPER L
STALS LM
Citation: W. Bijnens et al., ELECTRICAL-FIELD INDUCED AGING OF POLYMER LIGHT-EMITTING-DIODES IN ANOXYGEN-RICH ATMOSPHERE STUDIED BY EMISSION MICROSCOPY, SCANNING ELECTRON-MICROSCOPY AND SECONDARY-ION MASS-SPECTROSCOPY, Synthetic metals, 96(2), 1998, pp. 87-96
Authors:
RASRAS M
DEWOLF I
BENDER H
GROESENEKEN G
MAES HE
VANHAEVERBEKE S
DEPAUW P
Citation: M. Rasras et al., ANALYSIS OF I-DDQ FAILURES BY SPECTRAL PHOTON-EMISSION MICROSCOPY, Microelectronics and reliability, 38(6-8), 1998, pp. 877-882
Authors:
VANDAMME EP
DEWOLF I
LAUWERS A
VANDAMME LKJ
Citation: Ep. Vandamme et al., LOW-FREQUENCY NOISE-ANALYSIS AS A DIAGNOSTIC-TOOL TO ASSESS THE QUALITY OF 0.25-MU-M TI-SILICIDED POLY LINES, Microelectronics and reliability, 38(6-8), 1998, pp. 925-929
Authors:
BADENES G
ROOYACKERS R
JONES SK
BAZLEY D
BEANLAND R
DEWOLF I
DEFERM L
Citation: G. Badenes et al., OPTIMIZATION OF POLYSILICON ENCAPSULATED LOCAL OXIDATION OF SILICON -CAVITY DIMENSION EFFECTS ON MECHANICAL-STRESS AND GATE OXIDE INTEGRITY, Journal of the Electrochemical Society, 145(5), 1998, pp. 1653-1659
Authors:
BADENES G
ROOYACKERS R
DEWOLF I
DEFERM L
Citation: G. Badenes et al., POLYSILICON ENCAPSULATED LOCAL OXIDATION OF SILICON FOR DEEP-SUBMICRON LATERAL ISOLATION, JPN J A P 1, 36(3B), 1997, pp. 1325-1329
Authors:
DEWOLF I
HOWARD DJ
RASRAS M
LAUWERS A
MAEX K
GROESENEKEN G
MAES HE
Citation: I. Dewolf et al., A RELIABILITY STUDY OF TITANIUM SILICIDE LINES USING MICRO-RAMAN SPECTROSCOPY AND EMISSION MICROSCOPY, Microelectronics and reliability, 37(10-11), 1997, pp. 1591-1594
Authors:
RASRAS M
DEWOLF I
GROESENEKEN G
MAES HE
Citation: M. Rasras et al., MODIFICATION AND APPLICATION OF AN EMISSION MICROSCOPE FOR CONTINUOUSWAVELENGTH SPECTROSCOPY, Microelectronics and reliability, 37(10-11), 1997, pp. 1595-1598
Authors:
DEGRAEVE R
GROESENEKEN G
DEWOLF I
MAES HE
Citation: R. Degraeve et al., THE EFFECT OF EXTERNALLY IMPOSED MECHANICAL-STRESS ON THE HOT-CARRIER-INDUCED DEGRADATION OF DEEP-SUB MICRON NMOSFETS, I.E.E.E. transactions on electron devices, 44(6), 1997, pp. 943-950
Authors:
DEWOLF I
HOWARD DJ
LAUWERS A
MAEX K
MAES HE
Citation: I. Dewolf et al., LOCAL IDENTIFICATION AND MAPPING OF THE C49 AND C54 TITANIUM PHASES IN SUBMICRON STRUCTURES BY MICRO-RAMAN SPECTROSCOPY, Applied physics letters, 70(17), 1997, pp. 2262-2264
Authors:
DEWOLF I
Citation: I. Dewolf, MICRO-RAMAN SPECTROSCOPY TO STUDY LOCAL MECHANICAL-STRESS IN SILICON INTEGRATED-CIRCUITS, Semiconductor science and technology, 11(2), 1996, pp. 139-154
Authors:
DEWOLF I
POZZAT G
PINARDI K
HOWARD DJ
IGNAT M
JAIN SC
MAES HE
Citation: I. Dewolf et al., EXPERIMENTAL VALIDATION OF MECHANICAL-STRESS MODELS BY MICRO-RAMAN SPECTROSCOPY, Microelectronics and reliability, 36(11-12), 1996, pp. 1751-1754
Authors:
DEWOLF I
MAES HE
JONES SK
Citation: I. Dewolf et al., STRESS MEASUREMENTS IN SILICON DEVICES THROUGH RAMAN-SPECTROSCOPY - BRIDGING THE GAP BETWEEN THEORY AND EXPERIMENT, Journal of applied physics, 79(9), 1996, pp. 7148-7156
Authors:
JAIN SC
MAES HE
PINARDI K
DEWOLF I
Citation: Sc. Jain et al., STRESSES AND STRAINS IN LATTICE-MISMATCHED STRIPES, QUANTUM WIRES, QUANTUM DOTS, AND SUBSTRATES IN SI TECHNOLOGY, Journal of applied physics, 79(11), 1996, pp. 8145-8165
Authors:
GROESENEKEN GV
DEWOLF I
BELLENS R
MAES HE
Citation: Gv. Groeseneken et al., OBSERVATION OF SINGLE INTERFACE TRAPS IN SUBMICRON MOSFETS BY CHARGE-PUMPING, I.E.E.E. transactions on electron devices, 43(6), 1996, pp. 940-945
Authors:
SAKS NS
GROESENEKEN G
DEWOLF I
Citation: Ns. Saks et al., CHARACTERIZATION OF INDIVIDUAL INTERFACE TRAPS WITH CHARGE-PUMPING, Applied physics letters, 68(10), 1996, pp. 1383-1385
Authors:
DEWOLF I
ROOYACKERS R
MAES HE
Citation: I. Dewolf et al., STRESS VARIATION ACROSS ARRAYS OF LINES AND ITS INFLUENCE ON LOCOS OXIDATION, Microelectronic engineering, 28(1-4), 1995, pp. 79-82
Authors:
DEGRAEVE R
GROESENEKEN G
DEWOLF I
MAES HE
Citation: R. Degraeve et al., OXIDE AND INTERFACE DEGRADATION AND BREAKDOWN UNDER MEDIUM AND HIGH-FIELD INJECTION CONDITIONS - A CORRELATION STUDY, Microelectronic engineering, 28(1-4), 1995, pp. 313-316
Authors:
DEWOLF I
NORSTROM H
MAES HE
Citation: I. Dewolf et al., PROCESS-INDUCED MECHANICAL-STRESS IN ISOLATION STRUCTURES STUDIED BY MICRO-RAMAN SPECTROSCOPY, Journal of applied physics, 74(7), 1993, pp. 4490-4500
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1-19
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