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Results: 1-25 |
Results: 25
Microfabricated silicon solid immersion lens
Authors: Fletcher, DA Crozier, KB Guarini, KW Minne, SC Kino, GS Quate, CF Goodson, KE
Citation: Da. Fletcher et al., Microfabricated silicon solid immersion lens, J MICROEL S, 10(3), 2001, pp. 450-459
Surface characterization and electrochemical properties of alkyl, fluorinated alkyl, and alkoxy monolayers on silicon
Authors: Barrelet, CJ Robinson, DB Cheng, J Hunt, TP Quate, CF Chidsey, CED
Citation: Cj. Barrelet et al., Surface characterization and electrochemical properties of alkyl, fluorinated alkyl, and alkoxy monolayers on silicon, LANGMUIR, 17(11), 2001, pp. 3460-3465
Refraction contrast imaging with a scanning microlens
Authors: Fletcher, DA Crozier, KB Quate, CF Kino, GS Goodson, KE Simanovskii, D Palanker, DV
Citation: Da. Fletcher et al., Refraction contrast imaging with a scanning microlens, APPL PHYS L, 78(23), 2001, pp. 3589-3591
Parallel atomic force microscopy with optical interferometric detection
Authors: Sulchek, T Grow, RJ Yaralioglu, GG Minne, SC Quate, CF Manalis, SR Kiraz, A Aydine, A Atalar, A
Citation: T. Sulchek et al., Parallel atomic force microscopy with optical interferometric detection, APPL PHYS L, 78(12), 2001, pp. 1787-1789
Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure
Authors: Degertekin, FL Hadimioglu, B Sulchek, T Quate, CF
Citation: Fl. Degertekin et al., Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure, APPL PHYS L, 78(11), 2001, pp. 1628-1630
Integration of through-wafer interconnects with a two-dimensional cantilever array
Authors: Chow, EM Soh, HT Lee, HC Adams, JD Minne, SC Yaralioglu, G Atalar, A Quate, CF Kenny, TW
Citation: Em. Chow et al., Integration of through-wafer interconnects with a two-dimensional cantilever array, SENS ACTU-A, 83(1-3), 2000, pp. 118-123
Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process
Authors: Gotoh, Y Matsumoto, K Maeda, T Cooper, EB Manalis, SR Fang, H Minne, SC Hunt, T Dai, H Harris, J Quate, CF
Citation: Y. Gotoh et al., Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process, J VAC SCI A, 18(4), 2000, pp. 1321-1325
High-speed atomic force microscopy in liquid
Authors: Sulchek, T Hsieh, R Adams, JD Minne, SC Quate, CF Adderton, DM
Citation: T. Sulchek et al., High-speed atomic force microscopy in liquid, REV SCI INS, 71(5), 2000, pp. 2097-2099
Contact stiffness of layered materials for ultrasonic atomic force microscopy
Authors: Yaralioglu, GG Degertekin, FL Crozier, KB Quate, CF
Citation: Gg. Yaralioglu et al., Contact stiffness of layered materials for ultrasonic atomic force microscopy, J APPL PHYS, 87(10), 2000, pp. 7491-7496
Near-field infrared imaging with a microfabricated solid immersion lens
Authors: Fletcher, DA Crozier, KB Quate, CF Kino, GS Goodson, KE Simanovskii, D Palanker, DV
Citation: Da. Fletcher et al., Near-field infrared imaging with a microfabricated solid immersion lens, APPL PHYS L, 77(14), 2000, pp. 2109-2111
Microvolume field-effect pH sensor for the scanning probe microscope
Authors: Manalis, SR Cooper, EB Indermuhle, PF Kernen, P Wagner, P Hafeman, DG Minne, SC Quate, CF
Citation: Sr. Manalis et al., Microvolume field-effect pH sensor for the scanning probe microscope, APPL PHYS L, 76(8), 2000, pp. 1072-1074
High-resolution micromachined interferometric accelerometer
Authors: Cooper, EB Post, ER Griffith, S Levitan, J Manalis, SR Schmidt, MA Quate, CF
Citation: Eb. Cooper et al., High-resolution micromachined interferometric accelerometer, APPL PHYS L, 76(22), 2000, pp. 3316-3318
Thin film characterization by atomic force microscopy at ultrasonic frequencies
Authors: Crozier, KB Yaralioglu, GG Degertekin, FL Adams, JD Minne, SC Quate, CF
Citation: Kb. Crozier et al., Thin film characterization by atomic force microscopy at ultrasonic frequencies, APPL PHYS L, 76(14), 2000, pp. 1950-1952
High-speed tapping mode imaging with active Q control for atomic force microscopy
Authors: Sulchek, T Hsieh, R Adams, JD Yaralioglu, GG Minne, SC Quate, CF Cleveland, JP Atalar, A Adderton, DM
Citation: T. Sulchek et al., High-speed tapping mode imaging with active Q control for atomic force microscopy, APPL PHYS L, 76(11), 2000, pp. 1473-1475
Ultra-low resistance, through-wafer via (TWV) technology and its applications in three dimensional structures on silicon
Authors: Soh, HT Yue, CP McCarthy, A Ryu, C Lee, TH Wong, SS Quate, CF
Citation: Ht. Soh et al., Ultra-low resistance, through-wafer via (TWV) technology and its applications in three dimensional structures on silicon, JPN J A P 1, 38(4B), 1999, pp. 2393-2396
Scanning probe lithography using a cantilever with integrated transistor for on-chip control of the exposing current
Authors: Wilder, K Quate, CF
Citation: K. Wilder et Cf. Quate, Scanning probe lithography using a cantilever with integrated transistor for on-chip control of the exposing current, J VAC SCI B, 17(6), 1999, pp. 3256-3261
Synthesis, integration, and electrical properties of individual single-walled carbon nanotubes
Authors: Kong, J Zhou, C Morpurgo, A Soh, HT Quate, CF Marcus, C Dai, H
Citation: J. Kong et al., Synthesis, integration, and electrical properties of individual single-walled carbon nanotubes, APPL PHYS A, 69(3), 1999, pp. 305-308
Dendrimer-based self-assembled monolayers as resists for scanning probe lithography
Authors: Tully, DC Wilder, K Frechet, JMJ Trimble, AR Quate, CF
Citation: Dc. Tully et al., Dendrimer-based self-assembled monolayers as resists for scanning probe lithography, ADVAN MATER, 11(4), 1999, pp. 314-318
Synthesis and preparation of ionically bound dendrimer monolayers and application toward scanning probe lithography
Authors: Tully, DC Trimble, AR Frechet, JMJ Wilder, K Quate, CF
Citation: Dc. Tully et al., Synthesis and preparation of ionically bound dendrimer monolayers and application toward scanning probe lithography, CHEM MATER, 11(10), 1999, pp. 2892-2898
Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes
Authors: Wilder, K Soh, HT Atalar, A Quate, CF
Citation: K. Wilder et al., Nanometer-scale patterning and individual current-controlled lithography using multiple scanning probes, REV SCI INS, 70(6), 1999, pp. 2822-2827
Integrated nanotube circuits: Controlled growth and ohmic contacting of single-walled carbon nanotubes
Authors: Soh, HT Quate, CF Morpurgo, AF Marcus, CM Kong, J Dai, HJ
Citation: Ht. Soh et al., Integrated nanotube circuits: Controlled growth and ohmic contacting of single-walled carbon nanotubes, APPL PHYS L, 75(5), 1999, pp. 627-629
Terabit-per-square-inch data storage with the atomic force microscope
Authors: Cooper, EB Manalis, SR Fang, H Dai, H Matsumoto, K Minne, SC Hunt, T Quate, CF
Citation: Eb. Cooper et al., Terabit-per-square-inch data storage with the atomic force microscope, APPL PHYS L, 75(22), 1999, pp. 3566-3568
Dual integrated actuators for extended range high speed atomic force microscopy
Authors: Sulchek, T Minne, SC Adams, JD Fletcher, DA Atalar, A Quate, CF Adderton, DM
Citation: T. Sulchek et al., Dual integrated actuators for extended range high speed atomic force microscopy, APPL PHYS L, 75(11), 1999, pp. 1637-1639
Near-field photolithography with a solid immersion lens
Authors: Ghislain, LP Elings, VB Crozier, KB Manalis, SR Minne, SC Wilder, K Kino, GS Quate, CF
Citation: Lp. Ghislain et al., Near-field photolithography with a solid immersion lens, APPL PHYS L, 74(4), 1999, pp. 501-503
Electron beam and scanning probe lithography: A comparison
Authors: Wilder, K Quate, CF Singh, B Kyser, DF
Citation: K. Wilder et al., Electron beam and scanning probe lithography: A comparison, J VAC SCI B, 16(6), 1998, pp. 3864-3873
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