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Results: 1-25/27
Authors:
GANETSOS T
TSAMAKIS D
PANKNIN D
MAIR GLR
TEICHERT J
BISCHOFF L
AIDINIS C
Citation: T. Ganetsos et al., SI1-XGEX STRUCTURES FABRICATED BY FOCUSED ION-BEAM IMPLANTATION, Journal de physique. IV, 8(P3), 1998, pp. 109-112
Authors:
TEICHERT J
BISCHOFF L
HAUSMANN S
Citation: J. Teichert et al., ION-BEAM SYNTHESIS OF COBALT DISILICIDE USING FOCUSED ION-BEAM IMPLANTATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(4), 1998, pp. 2574-2577
Authors:
HAUSMANN S
BISCHOFF L
TEICHERT J
GRAMBOLE D
HERRMANN F
MOLLER W
Citation: S. Hausmann et al., INVESTIGATION OF DWELL-TIME EFFECTS ON THE COBALT DISILICIDE FORMATION USING FOCUSED ION-BEAM IMPLANTATION, Microelectronic engineering, 42, 1998, pp. 233-236
Authors:
TEICHERT J
VOELSKOW M
BISCHOFF L
HAUSMANN S
Citation: J. Teichert et al., RES AND CHANNELING ANALYSIS OF COBALT DISILICIDE LAYERS PRODUCED BY FOCUSED ION-BEAM IMPLANTATION, Vacuum, 51(2), 1998, pp. 261-266
Authors:
HAUSMANN S
BISCHOFF L
TEICHERT J
VOELSKOW M
GRAMBOLE D
HERRMANN F
MOLLER W
Citation: S. Hausmann et al., DOSE-RATE EFFECTS IN FOCUSED ION-BEAM SYNTHESIS OF COBALT DISILICIDE, Applied physics letters, 72(21), 1998, pp. 2719-2721
Authors:
SCHMIDT B
BISCHOFF L
TEICHERT J
Citation: B. Schmidt et al., WRITING FIB IMPLANTATION AND SUBSEQUENT ANISOTROPIC WET CHEMICAL ETCHING FOR FABRICATION OF 3D STRUCTURES IN SILICON, Sensors and actuators. A, Physical, 61(1-3), 1997, pp. 369-373
Authors:
TEICHERT J
BISCHOFF L
HAUSMANN S
Citation: J. Teichert et al., FABRICATION OF MSM DETECTOR STRUCTURES ON SILICON BY FOCUSED ION-BEAMIMPLANTATION, Microelectronic engineering, 35(1-4), 1997, pp. 455-458
Authors:
TEICHERT J
PREISS R
Citation: J. Teichert et R. Preiss, STUDIES ON THE METABOLISM OF ALPHA-LIPOID ACID IN HUMANS, Naunyn-Schmiedeberg's archives of pharmacology, 355(4), 1997, pp. 454-454
Authors:
HESSE E
DRIESEL W
DIETZSCH C
BISCHOFF L
TEICHERT J
Citation: E. Hesse et al., SHAPE OF A CO-ND LIQUID ALLOY ION-SOURCE, JPN J A P 1, 35(10), 1996, pp. 5564-5570
Authors:
DRIESEL W
DIETZSCH C
HESSE E
BISCHOFF L
TEICHERT J
Citation: W. Driesel et al., IN-SITU OBSERVATION OF THE TIP SHAPE OF CO-GE LIQUID ALLOY ION SOURCES IN A HIGH-VOLTAGE TRANSMISSION ELECTRON-MICROSCOPE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 1621-1629
Authors:
TEICHERT J
BISCHOFF L
HESSE E
SCHNEIDER P
PANKNIN D
GESSNER T
LOBNER B
ZICHNER N
Citation: J. Teichert et al., COBALT DISILICIDE INTERCONNECTS FOR MICROMECHANICAL DEVICES, Journal of micromechanics and microengineering, 6(2), 1996, pp. 272-278
Authors:
TEICHERT J
BISCHOFF L
KOHLER B
Citation: J. Teichert et al., INVESTIGATION OF THE ION-ACOUSTIC EFFECT DURING FOCUSED ION-BEAM IRRADIATION, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 120(1-4), 1996, pp. 311-314
Authors:
SCHNEIDER P
BISCHOFF L
TEICHERT J
HESSE E
Citation: P. Schneider et al., FOCUSED ION-BEAM SPUTTERING YIELD MEASUREMENTS FOR COBALT IONS ON SILICON AND RELATED MATERIALS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 117(1-2), 1996, pp. 77-80
Authors:
BISCHOFF L
HEINIG KH
TEICHERT J
SKORUPA W
Citation: L. Bischoff et al., SUBMICRON COSI2 STRUCTURES FABRICATED BY FOCUSED ION-BEAM IMPLANTATION AND LOCAL FLASH LAMP MELTING, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 112(1-4), 1996, pp. 201-205
Authors:
BISCHOFF L
TEICHERT J
HESSE E
PREWETT PD
WATSON JG
Citation: L. Bischoff et al., CLUSTER BEAMS FROM A CO-ND LIQUID ALLOY ION-SOURCE, Microelectronic engineering, 30(1-4), 1996, pp. 245-248
Authors:
HESSE E
MAIR GLR
BISCHOFF L
TEICHERT J
Citation: E. Hesse et al., PARAMETRIC INVESTIGATION OF CURRENT PULSES IN A LIQUID-METAL ION EMITTER, Journal of physics. D, Applied physics, 29(8), 1996, pp. 2193-2197
Authors:
TEICHERT J
BISCHOFF L
KOHLER B
Citation: J. Teichert et al., EVIDENCE FOR ACOUSTIC-WAVES INDUCED BY FOCUSED ION-BEAMS, Applied physics letters, 69(11), 1996, pp. 1544-1546
Authors:
TEICHERT J
PREISS R
Citation: J. Teichert et R. Preiss, DETERMINATION OF LIPOIC ACID IN HUMAN PLASMA BY HIGHPERFORMANCE LIQUID-CHROMATOGRAPHY WITH ELECTROCHEMICAL DETECTION, Journal of chromatography B. Biomedical applications, 672(2), 1995, pp. 277-281
Authors:
TEICHERT J
BISCHOFF L
HESSE E
SCHNEIDER P
PANKNIN D
GESSNER T
LOBNER B
ZICHNER N
Citation: J. Teichert et al., COMPARISON OF COSI2 INTERCONNECTION LINES ON CRYSTALLINE AND NONCRYSTALLINE SILICON FABRICATED BY WRITING FOCUSED ION-BEAM IMPLANTATION, Applied surface science, 91(1-4), 1995, pp. 44-49
Authors:
BISCHOFF L
TEICHERT J
HESSE E
Citation: L. Bischoff et al., INTERCONNECTION LINES FOLLOWING THE SURFACE-TOPOGRAPHY FABRICATED BY WRITING FOCUSED ION-BEAM IMPLANTATION, Microelectronic engineering, 27(1-4), 1995, pp. 351-354
Authors:
HESSE E
BISCHOFF L
TEICHERT J
Citation: E. Hesse et al., ANGULAR-DISTRIBUTION AND ENERGY SPREAD OF A LITHIUM LIQUID-METAL ION-SOURCE, Journal of physics. D, Applied physics, 28(8), 1995, pp. 1707-1709
Authors:
BISCHOFF L
TEICHERT J
HESSE E
PANKNIN D
SKORUPA W
Citation: L. Bischoff et al., COSI2 MICROSTRUCTURES BY MEANS OF A HIGH-CURRENT FOCUSED ION-BEAM, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(6), 1994, pp. 3523-3527
Authors:
HESSE E
NAEHRING FK
TEICHERT J
Citation: E. Hesse et al., A LITHIUM LIQUID-METAL ION-SOURCE WITH A NARROW-ANGLE EMISSION FOR WRITING BEAM LITHOGRAPHY, Microelectronic engineering, 23(1-4), 1994, pp. 111-114
Authors:
BISCHOFF L
HESSE E
PANKNIN D
SKORUPA W
TEICHERT J
Citation: L. Bischoff et al., WRITING IMPLANTATION WITH A HIGH-CURRENT DENSITY FOCUSED ION-BEAM, Microelectronic engineering, 23(1-4), 1994, pp. 115-118
Authors:
HESSE E
BISCHOFF L
TEICHERT J
Citation: E. Hesse et al., DEVELOPMENT OF A COBALT LIQUID ALLOY ION-SOURCE, Journal of physics. D, Applied physics, 27(2), 1994, pp. 427-428